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2SK1405 参数 Datasheet PDF下载

2SK1405图片预览
型号: 2SK1405
PDF下载: 下载PDF文件 查看货源
内容描述: 硅N沟道MOS FET [Silicon N Channel MOS FET]
分类和应用: 晶体晶体管功率场效应晶体管局域网
文件页数/大小: 7 页 / 92 K
品牌: RENESAS [ RENESAS TECHNOLOGY CORP ]
 浏览型号2SK1405的Datasheet PDF文件第1页浏览型号2SK1405的Datasheet PDF文件第3页浏览型号2SK1405的Datasheet PDF文件第4页浏览型号2SK1405的Datasheet PDF文件第5页浏览型号2SK1405的Datasheet PDF文件第6页浏览型号2SK1405的Datasheet PDF文件第7页  
2SK1405  
Absolute Maximum Ratings  
(Ta = 25°C)  
Item  
Drain to source voltage  
Gate to source voltage  
Drain current  
Symbol  
VDSS  
VGSS  
ID  
Ratings  
Unit  
600  
V
V
±30  
15  
A
*1  
Drain peak current  
ID(pulse)  
60  
15  
A
Body to drain diode reverse drain current  
Channel dissipation  
IDR  
Pch*2  
Tch  
A
60  
W
°C  
°C  
Channel temperature  
150  
Storage temperature  
Tstg  
–55 to +150  
Notes: 1. PW 10 µs, duty cycle 1%  
2. Value at TC = 25°C  
Electrical Characteristics  
(Ta = 25°C)  
Item  
Symbol  
Min  
600  
±30  
Typ  
Max  
Unit  
V
Test conditions  
ID = 10 mA, VGS = 0  
IG = ±100 µA, VDS = 0  
VGS = ±25 V, VDS = 0  
VDS = 500 V, VGS = 0  
ID = 1 mA, VDS = 10 V  
ID = 8 A, VGS = 10 V *3  
Drain to source breakdown voltage  
Gate to source breakdown voltage  
Gate to source leak current  
Zero gate voltage drain current  
Gate to source cutoff voltage  
V(BR)DSS  
V(BR)GSS  
IGSS  
V
±10  
250  
3.0  
0.50  
µA  
µA  
V
IDSS  
VGS(off)  
RDS(on)  
2.0  
Static drain to source on state  
resistance  
0.35  
Forward transfer admittance  
Input capacitance  
|yfs|  
Ciss  
Coss  
Crss  
td(on)  
tr  
9
14  
3150  
780  
110  
35  
S
ID = 8 A, VDS = 10 V *3  
pF  
pF  
pF  
ns  
ns  
ns  
ns  
V
VDS = 10 V, VGS = 0,  
f = 1 MHz  
Output capacitance  
Reverse transfer capacitance  
Turn-on delay time  
Rise time  
ID = 8 A, VGS = 10 V,  
RL = 3.75 Ω  
120  
240  
100  
1.0  
Turn-off delay time  
Fall time  
td(off)  
tf  
Body to drain diode forward voltage  
VDF  
trr  
IF = 15 A, VGS = 0  
Body to drain diode reverse recovery  
time  
140  
ns  
IF = 15 A, VGS = 0,  
diF/dt = 100 A/µs  
Note: 3. Pulse test  
Rev.3.00 May 15, 2006 page 2 of 6