VND5012AK-E
ELECTRICAL CHARACTERISTICS
(continued)
Table 8. Logic Input
Symbol
V
IL
I
IL
V
IH
I
IH
V
I(hyst)
V
ICL
V
CSDL
I
CSDL
V
CSDH
I
CSDH
V
CSD(hyst)
V
CSCL
Parameter
Input low level voltage
Low level input current
Input high level voltage
High level input current
Input hysteresis voltage
Input clamp voltage
CS_DIS low level voltage
Low level CS_DIS current
CS_DIS high level voltage
High level CS_DIS current
CS_DIS hysteresis voltage
CS_DIS clamp voltage
I
CSD
=1mA
I
CSD
=-1mA
V
CSD
= 2.1 V
0.25
5.5
-0.7
TBD
V
CSD
= 0.9V
1
2.1
10
I
IN
=1mA
I
IN
=-1mA
V
IN
= 2.1 V
0.25
5.5
-0.7
0.9
TBD
V
IN
=0.9 V
1
2.1
10
Test Conditions
Min.
Typ.
Max.
0.9
Unit
V
µA
V
µA
V
V
V
V
µA
V
µA
V
V
V
Table 9. Protections and Diagnostics
(see note 2)
Symbol
I
limH
I
limL
T
TSD
T
R
T
RS
T
HYST
V
DEMAG
V
ON
Parameter
DC Short circuit current
Short circuit current
during thermal cycling
Shutdown temperature
Reset temperature
Thermal reset of STATUS
Thermal hysteresis
(T
TSD
-T
R
)
Turn-off output voltage
clamp
Output voltage drop
limitation
I
OUT
=2A; V
IN
=0; L=6mH
I
OUT
=0.4A
T
j
= -40°C...+150°C (see fig. 9)
V
CC
=13V
5V<V
CC
<36V
V
CC
=13V; T
R
<T
j
<T
TSD
150
24
175
200
Test Conditions
Min.
40
Typ.
60
Max.
80
80
Unit
A
A
A
°C
°C
°C
7
V
CC
-41 V
CC
-46 V
CC
-52
25
°C
V
mV
T
RS
+ 1 T
RS
+ 5
135
Note: 2. To ensure long term reliability under heavy overload or short circuit conditions, protection and related diagnostic signals must be
used together with a proper software strategy. If the device operates under abnormal conditions this software must limit the duration
and number of activation cycles.
5/13