SLAS800 – MARCH 2013
Table 2. Terminal Functions (continued)
TERMINAL
NAME
P4.3/
TB0.0/
A12/
CA3
P4.4/
TB0.1/
A13/
CA4
P4.5/
TB0.2/
A14/
CA5
P4.6/
TBOUTH/
CAOUT/
A15/
CA6
P4.7/
TBCLK/
CAOUT/
CA7
RST/
NMI/SBWTDIO
TEST/
1
SBWTCK
DV
CC
AV
CC
DV
SS
AV
SS
QFN Pad
2
16
4
15
NA
38, 39
14
1, 4
13
Pad
NA
37
I
7
5
I
24
22
I/O
23
21
I/O
22
20
I/O
21
19
I/O
20
18
I/O
NO.
DA
RHA
General-purpose digital I/O pin
Timer_B, capture: CCI0B input, compare: OUT0 output
ADC10 analog input A12
Comparator_A+, CA3 input
General-purpose digital I/O pin
Timer_B, capture: CCI1B input, compare: OUT1 output
ADC10 analog input A13
Comparator_A+, CA4 input
General-purpose digital I/O pin
Timer_B, compare: OUT2 output
ADC10 analog input A14
Comparator_A+, CA5 input
General-purpose digital I/O pin
Timer_B, switch all TB0 to TB3 outputs to high impedance
Comparator_A+ Output
ADC10 analog input A15
Comparator_A+, CA6 input
General-purpose digital I/O pinCB0
Timer_B, clock signal TBCLK input
Comparator_A+ Output
Comparator_A+, CA7 input
Reset or nonmaskable interrupt input
Spy-Bi-Wire test data input/output during programming and test
Selects test mode for JTAG pins on Port 1. The device protection fuse is
connected to TEST.
Spy-Bi-Wire test clock input during programming and test
Digital supply voltage
Analog supply voltage
Digital ground reference
Analog ground reference
QFN package pad; connection to DV
SS
recommended.
I/O
DESCRIPTION
6
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