SBVS140 – MARCH 2010
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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION
(1)
PRODUCT
PACKAGE-LEAD
HTSSOP-32 PowerPAD™
(2)
TLC5970
QFN-28 6.0 mm × 6.0 mm
(1)
(2)
ORDERING NUMBER
TLC5970DAPR
TLC5970DAP
TLC5970RHPR
TLC5970RHPT
TRANSPORT MEDIA,
QUANTITY
Tape and Reel, 2000
Tube, 46
Tape and Reel, 3000
Tape and Reel, 250
For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI
web site at
Product preview device.
ABSOLUTE MAXIMUM RATINGS
(1) (2)
Over operating free-air temperature range, unless otherwise noted.
VALUE
MIN
Supply voltage
V
CC
BOOT
BOOT-PH difference
Input voltage
FB
IREF0 to IREF2, SWOFF
SDTA, SDTB, SCKA, SCKB
VROM
PH (steady-state)
PH (transient < 10 ns)
Output voltage
OUT0 to OUT2
SDTY, SDTZ, SCKY, SCKZ
VREG, VREGIF
PH (dc)
Output current
PH (peak)
OUT0 to OUT2
SDTY, SDTZ, SCKY, SCKZ
Human body model (HBM) SDTA, SDTB, SCKA, SCKB,
SDTY, SDTZ, SCKY, SCKZ
Electrostatic discharge rating
Human body model (HBM) Other pins
Charged device model (CDM) SDTA, SDTB, SCKA, SCKB,
SDTY, SDTZ, SCKY, SCKZ
Charged device model (CDM) Other pins
Operation junction temperature
Storage temperature
T
J
(max)
MAX
+40
+50
+10
+18
VREG + 0.3
+15
+21
+40
–1.2
UNIT
V
V
V
V
V
V
V
V
V
V
V
V
mA
A
mA
mA
kV
kV
V
V
°C
°C
–0.3
–0.3
–0.3
–0.3
–0.3
–10
–0.3
–0.6
–0.3
–10
–0.3
+18
+15
+6
–800
–2
+180
–35
+35
4
2
1000
500
+150
T
stg
–55
+150
(1)
(2)
Stresses beyond those listed under
absolute maximum ratings
may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under
recommended operating
conditions
is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
All voltage values are with respect to network ground terminal.
2
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