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EP1S40B1508C6ES 参数 Datasheet PDF下载

EP1S40B1508C6ES图片预览
型号: EP1S40B1508C6ES
PDF下载: 下载PDF文件 查看货源
内容描述: Stratix器件系列数据手册 [Stratix Device Family Data Sheet]
分类和应用:
文件页数/大小: 290 页 / 3583 K
品牌: ALTERA [ ALTERA CORPORATION ]
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Stratix Automated Single Event Upset (SEU) Detection
Local Update Mode
Local update mode is a simplified version of the remote update. This
feature is intended for simple systems that need to load a single
application configuration immediately upon power up without loading
the factory configuration first. Local update designs have only one
application configuration to load, so it does not require a factory
configuration to determine which application configuration to use.
shows the transition diagram for local update mode.
Figure 3–4. Local Update Transition Diagram
Power-Up
or nCONFIG
nCONFIG
Application
Configuration
Configuration
Error
Configuration
Error
nCONFIG
Factory
Configuration
Stratix
Automated
Single Event
Upset (SEU)
Detection
Stratix devices offer on-chip circuitry for automated checking of single
event upset (SEU) detection. FPGA devices that operate at high elevations
or in close proximity to earth’s North or South Pole require periodic
checks to ensure continued data integrity. The error detection cyclic
redundancy check (CRC) feature controlled by the
Device & Pin Options
dialog box in the Quartus II software uses a 32-bit CRC circuit to ensure
data reliability and is one of the best options for mitigating SEU.
3–12
Stratix Device Handbook, Volume 1
Altera Corporation
July 2005