Table 4 - A.C. Electrical Characteristics
Over the operating range9
-25
I-35
3V±10% 3.3V±10% 3V±10% 3.3V±10%
Symbol
Parameter
Units
Min Max Min Max Min Max Min Max
tPD
tOE
Input6 to non-registered output in continuous mode13
Input6 to output enable7
30
30
30
20
25
25
25
15
40
40
40
28
35
35
35
25
ns
ns
ns
ns
tOD
Input6 to output disable7
tCO1
Clock to Output
Clock to comb output delay via internal registered
tCO2
40
14
35
9
56
20
49
13
ns
feedback
tCF
tSC
Clock to Feedback
ns
ns
Input6 or feedback setup to clock
Input6 hold after clock
20
0
15
0
28
0
21
0
tHC
ns
tCL, tCH
tCP
Clock low time, clock high time9
Min clock period Ext (tSC + tCO1 )
Internal feedback 1/ (tSC + tCF) 12
External Feedback (1/ tCP) 12
No Feedback 1/ (tCL + tCH) 12
Asynchronous Reset Pulse Width
Input to Asynchronous Reset
20
40
29.4
25
25
30
13
28
18
ns
30
56
39
ns
fMAX1
fMAX2
fMAX3
tAW
41.6
33.3
38.4
25
20.8
17.9
17.9
40
29.4
25.6
27.7
35
MHz
MHz
MHz
ns
tAP
30
30
5
25
25
5
40
40
5
35
35
5
ns
tAR
Asynchronous Reset recovery time
Power-on reset time for registers in clear state14
ns
tRESET
µs
Inputs I/O,
Registered Feedback,
Synchronous Preset
Clock
Asynchronous
Reset
Registered
Outputs
Combinatorial
Outputs
Figure 7 - Switching Waveforms
Notes:
1.
Minimum DC input is -0.5V, however, inputs may undershoot to
-2.0V for periods less than 20 ns.
8.
9.
Capacitances are tested on a sample basis.
Test conditions assume: signal transition times of 3ns or less
from the 10% and 90% points, timing reference levels of 1.5V
(Unless otherwise specified).
2.
3.
VI and VO are not specified for program / verify operation.
The Supply Voltage range of 2.7 to 3.6V was chosen to allow
this part to be used in both 3V ±10% and 3.3V ±10%
applications.
10.
11.
Test one output at a time for duration of less than 1 second.
ICC for a typical application: This parameter is tested with the
device programmed as an 8-bit Counter.
4.
Test Points for Clock and VCC in tR and tF are referenced at
the 10% and 90% levels.
12.
Parameters are not 100% tested. Specifications are based on
initial characterization and are tested after any design process
modification that might affect operational frequency.
tPD , tOE , tOD , tCO , tSC , and tAP are approximately 5 ns.
slower on the first transaction from sleep mode.
All inputs at GND.
5.
6.
7.
I/O pins are 0V and VCC .
"Input" refers to an input pin signal.
13.
14.
tOE is measured from input transition to V REF± 0.1V, TOD is
measured from input transition to VOH -0.1V or VOL +0.1V;
VREF =VL.
Anachip Corp.
www.anachip.com.tw
Rev. 1.0 Dec 16, 2004
8/10
ANACHIP [ ANACHIP CORP ]
