FLASH
Austin Semiconductor, Inc.
DC CHARACTERISTICS
PARAMETER
Input Load Current
A9 Input Load Current
Output Leakage Current
V
CC
Active Current
V
CC
Active Current
1
2,3
AS8F128K32
MIN
MAX
±10
200
±10
140
200
6.5
2
-0.5
2.0
0.8
V
CC
+ 0.5
12.5
0.45
2.4
0.85 V
CC
V
CC
-0.4
3.2
4.2
UNIT
µA
µA
µA
mA
mA
mA
mA
V
V
V
V
V
V
V
V
SYM
I
LI
I
LIT
I
LO
I
CC1
I
CC2
CONDITION
V
IN
= V
SS
to V
CC
, V
CC
= V
CC
Max
V
CC
= V
CC
Max, A9 = 12.5V
V
OUT
= V
SS
to V
CC
, V
CC
= V
CC
Max
CEx\ = V
IL,
OE\ = V
IH
, V
CC
= V
CC
Max, f = 5MHz
CEx\ = V
IL,
OE\ = V
IH
, V
CC
= V
CC
Max, f = 5MHz
V
CC
= V
CC
Max, CEx\ and OE\ = V
IH,
f = 5MHz
V
CC
= V
CC
Max, CEx\ = V
CC
± 0.3V, OE\ = V
IH
V
CC
Standby Current
Input Low Voltage
Input High Voltage
TTL/NMOS
CMOS
I
CC3
I
CC3
V
IL
V
IH
V
ID
V
OL
Voltage for Autoselect and Temporary
Sector Unprotect
Output Low Voltage
TTL/NMOS
Output High Voltage
CMOS
Low V
CC
Lock-out Voltage
V
CC
= 5.0V
I
OL
= 12mA, V
CC
= V
CC
Min
I
OH
= -2.5mA, V
CC
= V
CC
Min
I
OH
= -2.5mA, V
CC
= V
CC
Min
I
OH
= -100µA, V
CC
= V
CC
Min
11.5
V
OH
V
OH1
V
OH2
V
LKO
NOTES:
1. The I
CC
current listed is typically less than 8 mA/MHz, with OE\ at V
IH
.
2. I
CC
active while Embedded Program or Embedded Erase Algorithm is in progress.
3. Not 100% tested.
FIGURE 7: Test Setup
TABLE 6: Test Specifications
CONDITION
Output Load
Output Load Capacitiance, C
L
(Including jig capacitance)
Input Rise and Fall Times
Input Pulse Levels
Input timing measurement
reference levels
Output timing measurement
reference levels
ALL SPEEDS
UNIT
1 TTL Gate
50
5
0.0 - 0.3
1.5
1.5
pF
ns
V
V
V
NOTE:
Diodes are IN3064 or equivalent.
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
AS8F128K32
Rev. 2.0 5/03
12
AUSTIN [ AUSTIN SEMICONDUCTOR ]
