Preliminary
GS816018/32/36T-250/225/200/166/150/133
AC Test Conditions
Parameter
Conditions
VDD – 0.2 V
Input high level
Input low level
0.2 V
1 V/ns
VDD/2
Input slew rate
Input reference level
VDDQ/2
Output reference level
Output load
Fig. 1
Notes:
1. Include scope and jig capacitance.
2. Test conditions as specified with output loading as shown in Fig.
1 unless otherwise noted.
3. Device is deselected as defined by the Truth Table.
Output Load 1
DQ
30pF*
50W
VDDQ/2
* Distributed Test Jig Capacitance
DC Electrical Characteristics
Parameter
Symbol
Test Conditions
Min
Max
Input Leakage Current
(except mode pins)
IIL
VIN = 0 to VDD
–1 uA
1 uA
VDD ³ VIN ³ VIH
0 V £ VIN £ VIH
–1 uA
–1 uA
1 uA
IIN1
ZZ Input Current
FT Input Current
100 uA
VDD ³ VIN ³ VIL
0 V £ VIN £ VIL
–100 uA
–1 uA
1 uA
1 uA
IIN2
IOL
Output Disable, VOUT = 0 to VDD
IOH = –8 mA, VDDQ = 2.375 V
IOH = –8 mA, VDDQ = 3.135 V
IOL = 8 mA
Output Leakage Current
Output High Voltage
Output High Voltage
Output Low Voltage
–1 uA
1.7 V
2.4 V
—
1 uA
—
VOH2
VOH3
VOL
—
0.4 V
Rev: 2.12 3/2002
15/28
© 1999, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GSI [ GSI TECHNOLOGY ]
