HY57V281620HC(L)T
ABSOLUTE MAXIMUM RATINGS
Parameter
Ambient Temperature
Storage Temperature
Voltage on Any Pin relative to V
S S
Voltage on V
DD
relative to V
SS
Short Circuit Output Current
Power Dissipation
Soldering Temperature
⋅
Time
T
A
T
STG
V
IN
, V
OUT
V
DD,
V
DDQ
I
O S
P
D
T
SOLDER
Symbol
0 ~ 70
-55 ~ 125
-1.0 ~ 4.6
-1.0 ~ 4.6
50
1
260
⋅
10
Rating
°C
°C
V
V
mA
W
°C ⋅
Sec
Unit
Note :
Operation at above absolute maximum rating can adversely affect device reliability.
DC OPERATING CONDITION
(T
A
=0 to 70°C )
Parameter
Power Supply Voltage
Input High voltage
Input Low voltage
Symbol
V
DD
, V
DDQ
V
IH
V
IL
Min
3.0
2.0
-0.3
Typ
3.3
3.0
0
Max
3.6
V
DDQ
+ 0.3
0.8
Unit
V
V
V
Note
1
1,2
1,3
Note :
1.All voltages are referenced to V
SS
= 0V
2.V
IH
(max) is acceptable 5.6V AC pulse width with <=3ns of duration.
3.V
IL
(min) is acceptable -2.0V AC pulse width with <=3ns of duration.
AC OPERATING TEST CONDITION
(T
A
=0 to 70°
C,
V
DD
=3.3
±
0.3V, V
SS
=0V)
Parameter
AC Input High / Low Level Voltage
Input Timing Measurement Reference Level Voltage
Input Rise / Fall Time
Output Timing Measurement Reference Level Voltage
Output Load Capacitance for Access Time Measurement
Symbol
V
IH
/ V
IL
Vtrip
tR / tF
Voutref
C
L
Value
2.4/0.4
1.4
1
1.4
50
Unit
V
V
ns
V
pF
1
Note
Note :
1.Output load to measure access times is equivalent to two TTL gates and one capacitor (50pF). For details, refer to AC/DC output
load circuit
Rev. 0.2/Aug. 01
5
HYNIX [ HYNIX SEMICONDUCTOR ]
