X24C01
ABSOLUTE MAXIMUM RATINGS*
Temperature Under Bias
*COMMENT
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
.................. –65°C to +135°C
Storage Temperature ....................... –65°C to +150°C
Voltage on any Pin with
This is a stress rating only and the functional operation of
the device at these or any other conditions above those
Respect to VSS
............................ –1.0V to +7.0V
D.C. Output Current ............................................ 5 mA
indicated in the operational sections of this specification is not
implied. Exposure to absolute maximum rating conditions
Lead Temperature (Soldering,
............................. 300°C
RECOMMENDED OPERATING CONDITIONS
10 Seconds)
for extended periods may affect device reliability.
Temperature
Min.
Max.
Supply Voltage
Limits
Commercial
Industrial
Military
0°C
–40°C
–55°C
70°C
+85°C
X24C01
4.5V to 5.5V
3.5V to 5.5V
3.0V to 5.5V
2.7V to 5.5V
X24C01-3.5
X24C01-3
X24C01-2.7
+125°C
D.C. OPERATING CHARACTERISTICS (Over recommended operating conditions, unless otherwise specified)
Limits
Symbol
Parameter
Min.
Max.
1
Units
Test Conditions
SCL = VCC x 0.1/VCC x 0.9 Levels
@ 100 KHz, SDA = Open
(1)
V
CC
V
CC
V
CC
Supply Current (Read)
Supply Current (Write)
Standby Current
ICC
mA
(2)
ICC
2
(1)
∝A
ISB1
100
SCL = SDA = V
,
CC
V
CC
= 5V 10%
(1)
∝A
∝A
∝A
V
Standby Current
SCL = SDA = VCC, VCC = 2.7V
V = GND to V
IN
ISB2
50
10
10
CC
I
LI
Input Leakage Current
Output Leakage Current
Input Low Voltage
CC
I
LO
VOUT = GND to VCC
(2)
V
x 0.3
VlL
–1.0
V
V
V
CC
(2)
V
x 0.7V + 0.5
CC
VIH
Input High Voltage
CC
V
I
OL
= 2.1 mA
Output Low Voltage
0.4
OL
3837 PGM T03
CAPACITANCE TA = 25°C, f = 1.0 MHz, VCC = 5V
Symbol
Parameter
Max.
Units
Test Conditions
(3)
V
V
= 0V
CI/O
Input/Output Capacitance (SDA)
Input Capacitance (SCL)
8
6
pF
pF
I/O
(3)
= 0V
CIN
IN
3837 PGM T05
Notes: (1) Must perform a stop command prior to measurement.
(2) VIL min. and VIH max. are for reference only and are not tested.
(3) This parameter is periodically sampled and not 100% tested.
8
ICMIC [ IC MICROSYSTEMS ]
