IDT7007S/L
High-Speed 32K x 8 Dual-Port Static RAM
Military, Industrial and Commercial Temperature Ranges
5V
5V
893Ω
DATA
OUT
BUSY
INT
DATA
OUT
347Ω
30pF
347Ω
5pF*
893Ω
AC Test Conditions
Input Pulse Levels
Input Rise/Fall Times
Input Timing Reference Levels
Output Reference Levels
Output Load
GND to 3.0V
5ns Max.
1.5V
1.5V
Figures 1 and 2
2940 tbl 11
.
2940 drw 05
2940 drw 06
Figure 1. AC Output Test Load
Figure 2. Output Test Load
(for t
LZ
, t
HZ
, t
WZ
, t
OW
)
* Including scope and jig.
AC Electrical Characteristics Over the
Operating Temperature and Supply Voltage Range
(4,5)
7007X15
Com'l Only
Symbol
READ CYCLE
t
RC
t
AA
t
ACE
t
AOE
t
OH
t
LZ
t
HZ
t
PU
t
PD
t
SOP
t
SAA
Read Cycle Time
Address Access Time
Chip Enable Access Time
(3)
Output Enable Access Time
Output Hold from Address Change
Output Low-Z Time
(1,2)
Output High-Z Time
(1,2)
Chip Enable to Power Up Time
(2)
Chip Disable to Power Down Time
(2)
Semaphore Flag Update Pulse (OE or
SEM)
Semaphore Address Access Time
15
____
____
____
____
7007X20
Com'l Only
Min.
Max.
7007X25 Com'l
& Military
Min.
Max.
Unit
Parameter
Min.
Max.
20
____
____
____
____
25
____
____
____
____
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
2940 tbl 12a
15
15
10
____
____
20
20
12
____
____
25
25
13
____
____
3
3
____
3
3
____
3
3
____
10
____
12
____
15
____
0
____
0
____
0
____
15
____
20
____
25
____
10
____
10
____
12
____
15
20
25
7007X35
Com'l &
Military
Symbol
READ CYCLE
t
RC
t
AA
t
ACE
t
AOE
t
OH
t
LZ
t
HZ
t
PU
t
PD
t
SOP
t
SAA
Read Cycle Time
Address Access Time
Chip Enable Access Time
(3)
Output Enable Access Time
Output Hold from Address Change
Output Low-Z Time
(1,2)
Output High-Z Time
(1,2)
Chip Enable to Power Up Time
(2)
Chip Disable to Power Down Time
(2)
Semaphore Flag Update Pulse (OE or
SEM)
Semaphore Address Access Time
35
____
____
____
____
7007X55
Com'l, Ind
& Military
Min.
Max.
Unit
Parameter
Min.
Max.
55
____
____
____
____
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
2940 tbl 12b
35
35
20
____
____
55
55
30
____
____
3
3
____
3
3
____
15
____
25
____
0
____
0
____
35
____
50
____
15
____
15
____
35
55
NOTES:
1. Transition is measured ±200mV from Low- or High-impedance voltage with Output Test Load (Figure 2).
2. This parameter is guaranteed by device characterization, but is not production tested.
3. To access RAM,
CE
= V
IL
and
SEM
= V
IH
. To access semaphore,
CE
= V
IH
and
SEM
= V
IL
.
4. 'X' in part numbers indicates power rating (S or L).
5. Industrial temperature: for other speeds, packages and powers contact your sales office.
8
IDT [ INTEGRATED DEVICE TECHNOLOGY ]
