IDT71V321/71V421S/L
High Speed 3.3V 2K x 8 Dual-Port Static RAM with Interrupts
Industrial and Commercial Temperature Ranges
DC Electrical Characteristics Over the Operating
Temperature and Supply Voltage Range(1,2) (VCC = 3.3V ± 0.3V)
71V321X25
71V421X25
Com'l
71V321X35
71V321X55
71V421X55
Com'l Only
71V421X35
Com'l Only
& Ind
Symbol
Parameter
Test Condition
Version
COM'L
Typ.
Max.
Typ.
55
Max.
125
Typ.
55
Max. Unit
ICC
Dynamic Operating
Current
(Both Ports Active)
S
L
55
55
130
100
115
85
mA
mA
mA
mA
mA
CE = VIL, Outputs Disabled
SEM = VIH
55
95
55
(3)
f = fMAX
IND
S
L
55
55
150
130
___
___
___
___
ISB1
ISB2
ISB3
ISB4
Standby Current
(Both Ports - TTL
Level Inputs)
COM'L
IND
S
L
15
15
35
20
15
15
35
20
15
15
35
20
CER = CEL = VIH
SEMR = SEML = VIH
(3)
f = fMAX
S
L
15
15
50
35
___
___
___
___
(5)
Standby Current
(One Port - TTL
Level Inputs)
COM'L
IND
S
L
25
25
75
55
25
25
70
50
25
25
60
40
CE"A" = VIL and CE"B" = VIH
Active Port Outputs Disabled,
(3)
f=fMAX
S
L
25
25
95
75
SEMR = SEML = VIH
___
___
___
___
Full Standby Current
(Both Ports - All
CMOS Level Inputs)
Both Ports
L and
CE
COM'L
IND
S
L
1.0
0.2
5
3
1.0
0.2
5
3
1.0
0.2
5
3
CER > VCC - 0.2V
VIN > VCC - 0.2V or
VIN < 0.2V, f = 0(4)
S
L
1.0
0.2
10
6
___
___
___
___
SEMR = SEML > VCC - 0.2V
Full Standby Current
(One Port - All
CMOS Level Inputs)
COM'L
IND
S
L
25
25
70
55
25
25
65
50
25
25
55
40
CE"A" < 0.2V and
(5)
CE"B" > VCC - 0.2V
=
L > VCC - 0.2V
SEMR SEM
S
L
25
25
85
70
VIN > VCC - 0.2V or VIN < 0.2V
Active Port Outputs Disabled
___
___
___
___
(3)
f = fMAX
3026 tbl 06
NOTES:
1. 'X' in part numbers indicates power rating (S or L).
2. VCC = 3.3V, TA = +25°C, and are not production tested. ICCDC = 70mA (Typ.).
3. At f = fMAX, address and control lines (except Output Enable) are cycling at the maximum frequency read cycle of 1/tRC and using "AC Test Conditions" of input levels
of GND to 3V.
4. f = 0 means no address or control lines change. Applies only to inputs at CMOS level standby.
5. Port "A" may be either left or right port. Port "B" is opposite from port "A".
Data Retention Characteristics(L Version Only)
(1)
Symbol
VDR
ICCDR
Parameter
Test Condition
Min.
Typ.
Max.
Unit
V
___
VCC for Data Retention
2.0
0
___
Data Retention Current
µA
VCC = 2V, CE > VCC - 0.2V
COM'L.
IND.
100
1500
(3)
___
tCDR
IN
CC
IN
Chip Deselect to Data
Retention Time
V > V - 0.2V or V < 0.2V
100
4000
µA
V
___
___
0
(3)
(2)
___
___
tR
Operation Recovery Time
tRC
V
3026 tbl 07
NOTES:
1. VCC = 2V, TA = +25°C, and is not production tested.
2. tRC = Read Cycle Time.
3. This parameter is guaranteed by device characterization but not production tested.
4
6.42
IDT [ INTEGRATED DEVICE TECHNOLOGY ]
