IDT7203/7204/7205/7206 CMOS ASYNCHRONOUS FIFO
2048 x 9, 4096 x 9, 8192 x 9 and 16384 x 9
MILITARY AND COMMERCIAL TEMPERATURE RANGES
PIN CONFIGURATIONS
W
D
8
D
3
D
2
D
1
D
0
XI
FF
Q
3
Q
8
GND
NC
R
Q
4
Q
5
Q
0
Q
1
Q
2
Q
3
Q
8
GND
1
2
3
4
5
6
7
8
9
10
11
12
13
14
P28-1
P28-2
D28-1
D28-3
SO28-3
28
27
26
25
24
23
22
21
20
19
18
17
16
15
Vcc
D
4
D
5
D
6
D
7
FL/RT
RS
EF
XO/HF
INDEX
D
2
D
1
D
0
XI
FF
Q
7
Q
6
Q
5
Q
4
R
2661 drw 02a
14
15
16
17
18
19
20
Q
0
Q
1
NC
Q
2
5
6
7
8
9
10
11
12
13
32
31
30
1
4
3
2
D
3
D
8
W
NC
Vcc
D
4
D
5
J32-1
&
L32-1
29
28
27
26
25
24
23
22
21
D
6
D
7
NC
FL
/
RT
RS
EF
XO HF
/
Q
7
Q
6
2661 drw 02b
DIP
TOP VIEW
NOTES:
1. The THINDIPs P28-2 and D28-3 are only available for the 7203/7204/
7205.
2. The small outline package SO28-3 is only available for the 7204.
3. Consult factory for CERPACK pinout.
PLCC/LCC
TOP VIEW
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol
V
TERM
Rating
Terminal
Voltage with
Respect to
GND
Operating
Temperature
Temperature
Under Bias
Storage
Temperature
DC Output
Current
Commercial
–0.5 to + 7.0
Military
–0.5 to +7.0
Unit
V
RECOMMENDED DC OPERATING
CONDITIONS
Symbol
V
CCM
V
CCC
GND
V
IH
(1)
V
IH
(1)
V
IL
(1)
Parameter
Military Supply
Voltage
Commercial Supply
Voltage
Supply Voltage
Input High Voltage
Commercial
Input High Voltage
Military
Input Low Voltage
Commercial and
Military
Min.
4.5
4.5
0
2.0
2.2
—
Typ.
5.0
5.0
0
—
—
—
Max.
5.5
5.5
0
—
—
0.8
Unit
V
V
V
V
V
V
T
A
T
BIAS
T
STG
I
OUT
0 to +70
–55 to +125
–55 to + 125
50
–55 to +125
–65 to +135
–65 to +155
50
°
C
°
C
°
C
mA
NOTE:
2661 tbl 01
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RAT-
INGS may cause permanent damage to the device. This is a stress rating
only and functional operation of the device at these or any other conditions
above those indicated in the operational sections of this specification is not
implied. Exposure to absolute maximum rating conditions for extended
periods may affect reliability.
NOTE:
1. 1.5V undershoots are allowed for 10ns once per cycle.
2661 tbl 02
5.04
2
IDT [ INTEGRATED DEVICE TECHNOLOGY ]
