ML145170
LANSDALE
Semiconductor,
Inc.
Figure 7. Test Circuit f
in
Ω
*Characteristic Impedance
Figure 8.
Figure 8a. Test Circuit, OSC Circuit Externally Driven
[Note]
Figure 8b. Circuit to Eliminate Self–Oscillation,
OSC Circuit Externally Driven
[Note]
µ
µ
Ω
Ω
Ω
Ω
Ω
Figure 9. Test Circuit, OSC Circuit with Crystal
Figure 10. Switching Waveform
Figure 11. Switching Waveform
Figure 12. Test Load Circuit
*Includes all probe and
fixture capacitance.
NOTE:
Use the circuit of Figure 8b to eliminate self–oscillation of the OSC
in
pin when the ML145170 has power applied with no external signal.
applied at V
in
. (Self–oscillation is not harmful to the ML145170 and does not damage the IC.)
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