Specifications
GAL16V8D
Specifications
GAL16V8
AC Switching Characteristics
Over Recommended Operating Conditions
COM / IND
TEST
PARAM.
COND
1
.
COM / IND
IND
COM / IND
DESCRIPTION
Input or I/O to Comb. Output
Clock to Output Delay
Clock to Feedback Delay
Setup Time, Input or Fdbk before Clk↑
Hold Time, Input or Fdbk after Clk↑
Maximum Clock Frequency with
External Feedback, 1/(tsu + tco)
Maximum Clock Frequency with
Internal Feedback, 1/(tsu + tcf)
Maximum Clock Frequency with
No Feedback
Clock Pulse Duration, High
Clock Pulse Duration, Low
Input or I/O to Output Enabled
OE to Output Enabled
Input or I/O to Output Disabled
OE to Output Disabled
3
2
—
-10
MIN.
-15
-20
-25
UNITS
MAX.
MAX. MIN.
MAX. MIN.
MAX. MIN.
t
pd
t
co
t
cf
2
t
su
t
h
A
A
—
—
—
A
10
7
6
—
—
—
3
2
—
12
0
45.5
15
10
8
—
—
—
3
2
—
13
0
41.6
20
11
9
—
—
—
3
2
—
15
0
37
25
12
10
—
—
—
ns
ns
ns
ns
ns
MHz
7.5
0
66.7
f
max
3
A
A
71.4
83.3
—
—
50
62.5
—
—
45.4
50
—
—
40
41.6
—
—
MHz
MHz
t
wh
t
wl
t
en
t
t
dis
t
—
—
B
B
C
C
6
6
1
1
1
1
—
—
10
10
10
10
8
8
—
—
—
—
—
—
15
15
15
15
10
10
—
—
—
—
—
—
18
18
18
18
12
12
—
—
—
—
—
—
20
20
20
20
ns
ns
ns
ns
ns
ns
1) Refer to
Switching Test Conditions
section.
2) Calculated from
fmax
with internal feedback. Refer to
fmax Descriptions
section.
3) Refer to
fmax Descriptions
section. Characterized but not 100% tested.
Capacitance (T
A
= 25°C, f = 1.0 MHz)
SYMBOL
C
I
C
I/O
PARAMETER
Input Capacitance
I/O Capacitance
MAXIMUM*
8
8
UNITS
pF
pF
TEST CONDITIONS
V
CC
= 5.0V, V
I
= 2.0V
V
CC
= 5.0V, V
I/O
= 2.0V
*Characterized but not 100% tested.
12
LATTICE [ LATTICE SEMICONDUCTOR ]
