Specifications
GAL18V10B
AC Switching Characteristics
Over Recommended Operating Conditions
COM
TEST
PARAM.
COND.
1
COM
COM
COM
DESCRIPTION
Input or I/O to Comb. Output
Clock to Output Delay
Clock to Feedback Delay
Setup Time, Input or Fdbk before Clk↑
Hold Time, Input or Fdbk after Clk↑
Maximum Clock Frequency with
External Feedback, 1/(tsu + tco)
Maximum Clock Frequency with
Internal Feedback, 1/(tsu + tcf)
Maximum Clock Frequency with
No Feedback
Clock Pulse Duration, High
Clock Pulse Duration, Low
Input or I/O to Output Enabled
Input or I/O to Output Disabled
Input or I/O to Asynch. Reset of Reg.
Asynch. Reset Pulse Duration
Asynch. Reset to Clk↑ Recovery Time
Synch. Preset to Clk↑ Recovery Time
—
—
—
5.5
0
90.9
-7
-10
-15
-20
UNITS
ns
ns
ns
ns
ns
MHz
MIN. MAX. MIN. MAX. MIN. MAX. MIN. MAX.
7.5
5.5
3.5
—
—
—
—
—
—
6
0
76.9
10
7
3.5
—
—
—
—
—
—
8
0
55.5
15
10
7
—
—
—
—
—
—
12
0
41.6
20
12
10
—
—
—
t
pd
t
co
t
cf
2
t
su
t
h
A
A
—
—
—
A
f
max
3
A
A
111
111
—
—
105
105
—
—
66.7
66.7
—
—
45.4
62.5
—
—
MHz
MHz
t
wh
t
wl
t
en
t
dis
t
ar
t
arw
t
arr
t
spr
—
—
B
C
A
—
—
—
4
4
—
—
—
8
8
10
—
—
8
8
13
—
—
—
4
4
—
—
—
8
8
10
—
—
10
9
13
—
—
—
6
6
—
—
—
10
10
10
—
—
15
15
20
—
—
—
8
8
—
—
—
15
15
12
—
—
20
20
20
—
—
—
ns
ns
ns
ns
ns
ns
ns
ns
1) Refer to
Switching Test Conditions
section.
2) Calculated from
fmax
with internal feedback. Refer to
fmax Description
section.
3) Refer to
fmax Description
section.
Capacitance (T
A
= 25°C, f = 1.0 MHz)
SYMBOL
C
I
C
I/O
PARAMETER
Input Capacitance
I/O Capacitance
MAXIMUM*
8
8
UNITS
pF
pF
TEST CONDITIONS
V
CC
= 5.0V, V
I
= 2.0V
V
CC
= 5.0V, V
I/O
= 2.0V
*Characterized but not 100% tested.
7
LATTICE [ LATTICE SEMICONDUCTOR ]
