ABSOLUTE MAXIMUM RATINGS
Storage Temperature . . . . . . . . . . . . . .-65°C to +150°C
Ambient Temperature with
Power Applied . . . . . . . . . . . . . . . . . .-55°C to +125°C
Supply Voltage with Respect
to Ground . . . . . . . . . . . . . . . . . . . . . -0.5 V to +7.0 V
DC Input Voltage . . . . . . . . . . . . -0.5 V to V
CC
+ 1.0 V
DC Output or I/O Pin Voltage . . . -0.5 V to V
CC
+ 1.0 V
Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V
Latchup Current (T
A
= 0°C to +75°C) . . . . . . . . 100 mA
Stresses above those listed under Absolute Maximum Ratings
may cause permanent device failure. Functionality at or above
these limits is not implied. Exposure to Absolute Maximum
Ratings for extended periods may affect device reliability.
Programming conditions may vary.
OPERATING RANGES
Commercial (C) Devices
Ambient Temperature (T
A
)
Operating in Free Air . . . . . . . . . . . . . . . 0°C to +75°C
Supply Voltage (V
CC
) with
Respect to Ground. . . . . . . . . . . . . +4.75 V to +5.25 V
Operating ranges define those limits between which the func-
tionality of the device is guaranteed.
DC CHARACTERISTICS OVER COMMERCIAL OPERATING RANGES
Symbol
V
OH
V
OL
V
IH
V
IL
I
IH
I
IL
I
OZH
I
OZL
I
SC
I
CC
(Static)
I
CC
(Dynamic)
Parameter Description
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
Input HIGH Leakage Current
Input LOW Leakage Current
Off-State Output Leakage
Current HIGH
Off-State Output Leakage
Current LOW
Output Short-Circuit
Current
Supply Current
Supply Current
Test Conditions
IOH = -3.2 mA, VIN = VIH or VIL, VCC = Min
IOL = 16 mA, VIN = VIH or VIL, VCC = Min
Guaranteed Input Logical HIGH
Voltage for all Inputs (Note 1)
Guaranteed Input Logical LOW
Voltage for all Inputs (Note 1)
VIN = VCC, VCC = Max (Note 2)
VIN = 0 V, VCC = Max (Note 2)
VOUT = VCC, VCC = Max, VIN = VIL or VIH (Note 2)
VOUT = 0 V, VCC = Max, VIN = VIL or VIH (Note 2)
VOUT = 0.5 V, VCC = Max
TA = 25°C (Note 3)
Outputs Open, (IOUT = 0 mA), VCC = Max
Outputs Open, (I
OUT
= 0 mA), VCC = Max, f = 25 MHz
-30
Min
2.4
0.4
2.0
0.8
10
-100
10
-100
-130
115
140
Max
Unit
V
V
V
V
µA
µA
µA
µA
mA
mA
mA
Notes:
1. These are absolute values with respect to the device ground, and all overshoots due to system and tester noise are included.
2. I/O pin leakage is the worst case of IIL and IOZL (or IIH and IOZH).
3. Not more than one output should be tested at a time. Duration of the short-circuit test should not exceed one second.
VOUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
10
PALCE22V10H-7 (Com’l)
LATTICE [ LATTICE SEMICONDUCTOR ]
