4 Megabit (512K x 8-Bit) CMOS SRAM
T
ABLE
6. 33C408 AC T
EST
C
ONDITIONS AND
C
HARACTERISTICS
(V
CC
= 5.0 + 10%, T
A
= -55
TO
+125
°
C,
UNLESS OTHERWISE NOTED
)
P
ARAMETER
Input Rise/Fall Time
Input Timing Measurement Reference Level
M
IN
--
--
T
YP
--
--
M
AX
3.0
1.5
33C408
U
NITS
ns
V
T
ABLE
7. 33C408 AC C
HARACTERISTICS FOR
R
EAD
C
YCLE
(V
CC
= 5V + 10%, T
A
= -55
TO
+125
°
C,
UNLESS OTHERWISE SPECIFIED
)
P
ARAMETER
Read Cycle Time
-20
-25
-30
Address Access Time
-20
-25
-30
Chip Select Access Time
-20
-25
-30
Output Enable to Output Valid
-20
-25
-30
Chip Enable to Output in Low-Z
-20
-25
-30
Output Enable to Output in Low-Z
-20
-25
-30
Chip Deselect to Output in High-Z
-20
-25
-30
Output Disable to Output in High-Z
-20
-25
-30
Output Hold from Address Change
-20
-25
-30
S
YMBOL
t
RC
S
UBGROUPS
9, 10, 11
20
25
30
t
AA
9, 10, 11
--
--
--
t
CO
9, 10, 11
--
--
--
t
OE
9, 10, 11
--
--
--
t
LZ
9, 10, 11
--
--
--
t
OLZ
9, 10, 11
--
--
--
t
HZ
9, 10, 11
--
--
--
t
OHZ
9, 10, 11
--
--
--
t
OH
9, 10, 11
3
5
6
04.16.02 REV 8
M
IN
T
YP
--
--
--
--
--
--
--
--
--
--
--
--
3
3
3
0
0
0
5
6
8
5
6
8
--
--
--
M
AX
--
--
--
U
NIT
ns
ns
20
25
30
ns
20
25
30
10
12
14
--
--
--
ns
--
--
--
ns
--
--
--
ns
--
--
--
ns
--
--
--
ns
ns
All data sheets are subject to change without notice
4
©2002 Maxwell Technologies
All rights reserved.
MAXWELL [ MAXWELL TECHNOLOGIES ]
