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MT46V64M8TG-8 参数 Datasheet PDF下载

MT46V64M8TG-8图片预览
型号: MT46V64M8TG-8
PDF下载: 下载PDF文件 查看货源
内容描述: 双倍数据速率DDR SDRAM [DOUBLE DATA RATE DDR SDRAM]
分类和应用: 动态存储器双倍数据速率
文件页数/大小: 68 页 / 2546 K
品牌: MICRON [ MICRON TECHNOLOGY ]
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ADVANCE
512Mb: x4, x8, x16
DDR SDRAM
FUNCTIONAL DESCRIPTION
The 512Mb DDR SDRAM is a high-speed CMOS,
dynamic random-access memory containing
536,870,912 bits. The 512Mb DDR SDRAM is internally
configured as a quad-bank DRAM.
The 512Mb DDR SDRAM uses a double data rate
architecture to achieve high-speed operation. The
double data rate architecture is essentially a 2n-
prefetch architecture, with an interface designed to
transfer two data words per clock cycle at the I/O pins.
A single read or write access for the 512Mb DDR SDRAM
consists of a single 2n-bit wide, one-clock-cycle data
transfer at the internal DRAM core and two correspond-
ing
n-bit
wide, one-half-clock-cycle data transfers at
the I/O pins.
Read and write accesses to the DDR SDRAM are
burst oriented; accesses start at a selected location and
continue for a programmed number of locations in a
programmed sequence. Accesses begin with the regis-
tration of an ACTIVE command, which is then followed
by a READ or WRITE command. The address bits regis-
tered coincident with the ACTIVE command are used
to select the bank and row to be accessed (BA0, BA1
select the bank; A0-A12 select the row). The address
bits registered coincident with the READ or WRITE com-
mand are used to select the starting column location
for the burst access.
Prior to normal operation, the DDR SDRAM must be
initialized. The following sections provide detailed in-
formation covering device initialization, register defi-
nition, command descriptions and device operation.
LECT or NOP command should be applied, and CKE
should be brought HIGH. Following the NOP command,
a PRECHARGE ALL command should be applied. Next
a LOAD MODE REGISTER command should be issued
for the extended mode register (BA1 LOW and BA0
HIGH) to enable the DLL, followed by another LOAD
MODE REGISTER command to the mode register (BA0/
BA1 both LOW) to reset the DLL and to program the
operating parameters. Two-hundred clock cycles are
required between the DLL reset and any READ com-
mand. A PRECHARGE ALL command should then be
applied, placing the device in the all banks idle state.
Once in the idle state, two AUTO REFRESH cycles
must be performed (
t
RFC must be satisfied.) Addition-
ally, a LOAD MODE REGISTER command for the mode
register with the reset DLL bit deactivated (i.e., to pro-
gram operating parameters without resetting the DLL)
is required. Following these requirements, the DDR
SDRAM is ready for normal operation.
Register Definition
MODE REGISTER
The mode register is used to define the specific
mode of operation of the DDR SDRAM. This definition
includes the selection of a burst length, a burst type, a
CAS latency and an operating mode, as shown in Fig-
ure 1. The mode register is programmed via the MODE
REGISTER SET command (with BA0 = 0 and BA1 = 0)
and will retain the stored information until it is pro-
grammed again or the device loses power (except for
bit A8, which is self-clearing).
Reprogramming the mode register will not alter the
contents of the memory, provided it is performed cor-
rectly. The mode register must be loaded (reloaded)
when all banks are idle and no bursts are in progress,
and the controller must wait the specified time before
initiating the subsequent operation. Violating either
of these requirements will result in unspecified opera-
tion.
Mode register bits A0-A2 specify the burst length,
A3 specifies the type of burst (sequential or inter-
leaved), A4-A6 specify the CAS latency, and A7-A12
specify the operating mode.
Burst Length
Read and write accesses to the DDR SDRAM are
burst oriented, with the burst length being program-
mable, as shown in Figure 1. The burst length deter-
mines the maximum number of column locations that
can be accessed for a given READ or WRITE command.
Burst lengths of 2, 4, or 8 locations are available for both
Initialization
DDR SDRAMs must be powered up and initialized
in a predefined manner. Operational procedures other
than those specified may result in undefined opera-
tion. Power must first be applied to V
DD
and V
DD
Q simul-
taneously, and then to V
REF
(and to the system V
TT
). V
TT
must be applied after V
DD
Q to avoid device latch-up,
which may cause permanent damage to the device.
V
REF
can be applied any time after V
DD
Q but is expected
to be nominally coincident with V
TT
. Except for CKE,
inputs are not recognized as valid until after V
REF
is
applied. CKE is an SSTL_2 input but will detect an
LVCMOS LOW level after V
DD
is applied. Maintaining
an LVCMOS LOW level on CKE during power-up is re-
quired to ensure that the DQ and DQS outputs will be
in the High-Z state, where they will remain until driven
in normal operation (by a read access). After all power
supply and reference voltages are stable, and the clock
is stable, the DDR SDRAM requires a 200µs delay prior
to applying an executable command.
Once the 200µs delay has been satisfied, a DESE-
512Mb: x4, x8, x16 DDR SDRAM
512Mx4x8x16DDR_B.p65 – Rev. B; Pub 4/01
9
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2001, Micron Technology, Inc.