WF5025 series
WF5025ML× (2.5V operation)
V
DD
= 2.25 to 2.75V, V
SS
= 0V, Ta =
−40
to +85°C unless otherwise noted.
Rating
*1
Parameter
HIGH-level output voltage
LOW-level output voltage
HIGH-level input voltage
LOW-level input voltage
Output leakage current
Symbol
V
OH
V
OL
V
IH
V
IL
I
Z
Condition
min
Q: Measurement cct 1, V
DD
= 2.25V, I
OH
= 8mA
Q: Measurement cct 2, V
DD
= 2.25V, I
OL
= 8mA
INHN
INHN
Q: Measurement cct 2, INHN = LOW
Measurement cct 3, load cct 1,
INHN = open, C
L
= 15pF
f = 100MHz
f = 133MHz
f = 72MHz
I
DD2
Measurement cct 3, load cct 1,
INHN = open, C
L
= 30pF
Measurement cct 3, INHN = LOW
Measurement cct 4
20
WF5025MLA
AC feedback resistance
R
f1
Design value. A monitor pattern on a wafer is
tested.
Measurement cct 5
Design value. A monitor pattern on a wafer is tested.
Design value. A monitor pattern on a wafer is tested.
WF5025MLA
C
G
Built-in capacitance
WF5025MLA
C
D
Design value. A monitor pattern on a wafer is
tested.
WF5025MLB
WF5025MLC
*1. Values in parentheses ( ) are provisional only.
3.40
(3.40)
3.40
4
(4)
4
4.60
(4.60)
4.60
pF
pF
pF
Design value. A monitor pattern on a wafer is
tested.
WF5025MLB
WF5025MLC
WF5025MLB
WF5025MLC
DC feedback resistance
Oscillator amplifier output
resistance
AC feedback capacitance
R
f2
R
D
C
f
3.99
TBD
2.97
50
85
8.5
1.70
(1.70)
0.85
100
4.7
TBD
3.5
–
100
10
2
(2)
1
200
5.41
TBD
4.03
150
115
11.5
2.30
(2.30)
1.15
kΩ
kΩ
kΩ
kΩ
kΩ
Ω
pF
pF
pF
pF
f = 100MHz
f = 100MHz
Standby current
INHN pull-up resistance
I
ST
R
UP1
R
UP2
V
OH
= V
DD
V
OL
= V
SS
WF5025MLB
WF5025MLC
WF5025MLA
WF5025MLB
WF5025MLC
1.65
–
0.7V
DD
–
–
–
–
–
–
–
–
–
2
typ
1.95
0.3
–
–
–
–
TBD
15
11
TBD
15
–
6
max
–
0.4
–
0.3V
DD
10
10
TBD
30
22
TBD
30
3
12
V
V
V
V
µA
µA
mA
mA
mA
mA
mA
µA
MΩ
Unit
I
DD1
Current consumption
NIPPON PRECISION CIRCUITS INC.—8
NPC [ NIPPON PRECISION CIRCUITS INC ]
