5041 series
MEASUREMENT CIRCUITS
Measurement Circuit 1
Parameters: I
DD
, I
ST
, Duty, t
r
, t
f
I
DD
I
ST
I
DD
: Open
DUTY,
t
r
,
t
f
: Short
I
ST
: Open or Short
Q
XTN
INHN VSS
I
DD
, DUTY,
t
r
,
t
f
: Open
I
ST
: Short
C
LOUT
= 15pF
(Including probe
capacitance)
INHN VSS
I
Z
Measurement Circuit 4
Parameters: I
Z
A
VDD
XT
Crystal
VDD
V
DD
Q
A
or
V
SS
Note: The AC characteristics are observed using an oscilloscope on
pin Q.
Measurement Circuit 5
Parameters: V
IH
, V
IL
Measurement Circuit 2
Parameters: t
OD
VDD
VDD
0.001µF
XT
INHN VSS
50Ω
V
DD
or
R
L1
=1kΩ
Q
R
L2
=1kΩ
V
IH
V
IL
V
V
T1
V
T2
INHN VSS
Signal
Generator
V
SS
Measurement Circuit 6
Parameters: R
PU1
, R
PU2
XT input signal: 1Vp-p, sine wave
Measurement Circuit 3
Parameters: V
OH
, V
OL
VDD
INHN VSS
VDD
50Ω
V
IN
V
A
I
PU
R
PU1
=
V
DD
I
PU
(V
IN
= 0V)
Signal
Generator
0.001µF
XT
VSS
50Ω
Q
V
OH
V
V
OL
0.1µF
V
S
R
PU2
= V
DD
0.7V
DD
(V
IN
= 0.7V
DD
)
I
PU
∆V
V
OH
V
S
V
S
V
OL
∆V
V
S
adjusted such that
∆V
=
50
×
I
OH
.
XT input signal: 1Vp-p, sine wave
V
S
adjusted such that
∆V
=
50
×
I
OL
.
SEIKO NPC CORPORATION—8
NPC [ NIPPON PRECISION CIRCUITS INC ]
