5076 series
Current Consumption
5
4
Measurement circuit
I
DD
A
VDD
Crystal
XT
I
DD
[mA]
3
2
XTN
C
LOUT
= 15pF
V
C
= 0V
V
C
= 0.5V
DD
V
C
= V
DD
V
C
= 0V
V
C
= 0.5V
DD
V
C
= V
DD
Q
VC
0.1µF
1
C
LOUT
= No load
1.6
1.7
1.8
V
DD
[V]
1.9
VSS
0
2.0
f
OUT
= 27MHz, Ta = R.T.
Frequency Stability by Supply Voltage Change
Measurement circuit
3.0
VDD
2.0
1.0
∆f/f
[ppm]
0.0
−1.0
−2.0
−3.0
V
C
= 0V
V
C
= 1.8V
V
C
= 0.9V
Crystal
XT
XTN
VC
Q
0.1µF
VSS
C
LOUT
= 15pF
(Including probe
capacitance)
1.6
1.7
1.8
V
DD
[V]
1.9
2.0
f
OUT
= 27MHz,
±
0ppm at V
DD
= 1.8V
Drive Level
30
25
Measurement circuit
VDD
Crystal
XT
0.1µF
Drive level [µW]
20
15
10
5
0
0.0
0.3
0.6
0.9
V
C
[V]
1.2
1.5
1.8
Tektronix CT-6
Current Probe
XTN
I
X'tal
VC
Q
VSS
C
LOUT
= 15pF
V
DD
= 1.8V, f
OUT
= 27MHz, Ta = R.T.
DL = (I
X’tal
)
2
×
Re
DL: drive level
I
X’tal
: current flowing to crystal (RMS value)
Re: crystal effective resistance
SEIKO NPC CORPORATION —10
NPC [ NIPPON PRECISION CIRCUITS INC ]
