WF5076BM-4 参数 Datasheet PDF下载

5076 series

Negative Resistance

Frequency [MHz]

25

30

35

Measurement circuit

15

0

20

40

45

Negative resistance [Ω]

V

C

= 1.8V

−200

V

C

= 0.9V

Network Analyzer

(Agilent 4396B)

S-Parameter Test Set

(Agilent 85046A)

C0 = 2pF

VDD

XT

0.1µF

XTN

VC

Q

−400

VSS

−600

V

C

= 0V

−800

V

DD

= 1.8V, C0 = 2pF, Ta = R.T.

Note. "C0" value is set, concerning the actual crystal characteristics connected between XT and XTN. The data is measured with Agilent 4396B using

NPC’s original measurement jig. The values may vary with measurement jig and conditions.

Phase Noise

−60

−80

−100

−120

−140

−160

10

100

Measurement circuit

VDD

Crystal

Phase noise [dBc/Hz]

XT

0.1µF

200Ω

Q

XTN

VC

0.01µF

Signal Source

Analyzer

(Agilent E5052A)

VSS

V

C

= 1.8V

V

C

= 0.9V

V

C

= 0V

1,000

10,000 100,000 1,000,000 10,000,000

Offset Frequency [Hz]

C

LOUT

= 15pF

V

DD

= 1.8V, f

OUT

= 27MHz, Ta = R.T.

SEIKO NPC CORPORATION —11