5076 series
Modulation Characteristics
3
Measurement circuit
VDD
0
−3
−6
−9
−12
Modulation
signal
Crystal
XT
0.1µF
Q
XTN
R1
VC
R2
fm [dB]
Gain-phase
Analyzer
(HP 4194A)
Modulaiton
Analyzer
(HP 8901B)
0
1
10
Frequency [kHz]
100
1000
C1
VSS
C
LOUT
= 15pF
Demodulation
signal
C1 = 33µF, R1 = R2 = 1MΩ
VC modulation signal: 100Hz to 100kHz, 0 to V
DD
p-p
V
DD
= 1.8V, f
OUT
= 27MHz, Ta = R.T.
Output Waveform
Measurement equipment: Oscilloscope; DSO80604B (Agilent)
Measurement circuit
VDD
Crystal
XT
XTN
VC
0.1µF
Q
VSS
C
LOUT
= 15pF
(Including probe
capacitance)
V
DD
= 1.8V, f
OUT
= 27MHz, V
C
= 0.5V
DD
,
C
LOUT
= 15pF, Ta = R.T.
SEIKO NPC CORPORATION —12