8 Megabit Multi-Purpose Flash
SST39VF800Q / SST39VF800
Advance Information
Absolute Maximum Stress Ratings (Applied conditions greater than those listed under “Absolute Maximum Stress
Ratings”maycausepermanentdamagetothedevice. Thisisastressratingonlyandfunctionaloperationofthedevice
at these conditions or conditions greater than those defined in the operational sections of this data sheet is not implied.
Exposure to absolute maximum stress rating conditions may affect device reliability.)
Temperature Under Bias ................................................................................................................. -55°C to +125°C
Storage Temperature ...................................................................................................................... -65°C to +150°C
D. C. Voltage on Any Pin to Ground Potential ...................................................................... -0.5V to VDDQ (2) + 0.5V
Transient Voltage (<20 ns) on Any Pin to Ground Potential.................................................. -1.0V to VDDQ (2) + 1.0V
Voltage on A9 Pin to Ground Potential ................................................................................................ -0.5V to 13.2V
Package Power Dissipation Capability (Ta = 25°C) ........................................................................................... 1.0W
Surface Mount Lead Soldering Temperature (3 Seconds) ............................................................................... 240°C
Output Short Circuit Current(1) ................................................................................................................................................................. 50 mA
Note: (1) Outputs shorted for no more than one second. No more than one output shorted at a time.
(2) The absolute maximum stress ratings for SST39VF800 are referenced to VDD
.
OPERATING RANGE
Range
Ambient Temp
0 °C to +70 °C
-40 °C to +85 °C
VDD
VDDQ
Commercial
Industrial
2.7 - 3.6V
2.7 - 3.6V
VDD or 4.5 - 5.5V
VDD or 4.5 - 5.5V
AC CONDITIONS OF TEST
Input Rise/Fall Time......... 10 ns
Output Load..................... CL = 100 pF
See Figures 14 and 15
© 1999 Silicon Storage Technology, Inc.
343-04 2/99
8
SST [ SILICON STORAGE TECHNOLOGY, INC ]
