WCSS0418V1P
Electrical Characteristics
Over the Operating Range
Parameter
V
DD
V
DDQ
V
OH
V
OL
V
IH
V
IH
V
IL
V
IL
I
X
Description
Power Supply Voltage
I/O Supply Voltage
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
Input HIGH Voltage
Input LOW
Voltage
[7]
Input LOW Voltage
[7]
Input Load Current
except ZZ and MODE
3.3V
−5%/+10%
2.5V
−5%
to 3.3V +10%
V
DDQ
= 3.3V, V
DD
= Min., I
OH
= –4.0 mA
V
DDQ
= 2.5V, V
DD
= Min., I
OH
= –2.0 mA
V
DDQ
= 3.3V, V
DD
= Min., I
OL
= 8.0 mA
V
DDQ
= 2.5V, V
DD
= Min., I
OL
= 2.0 mA
V
DDQ
= 3.3V
V
DDQ
= 2.5V
V
DDQ
= 3.3V
V
DDQ
= 2.5V
GND
≤
V
I
≤
V
DDQ
2.0
1.7
–0.3
–0.3
−5
−30
5
−5
30
−5
6-ns cycle, 166 MHz
7.5-ns cycle, 133 MHz
10-ns cycle, 100 MHz
I
SB1
Automatic CS
Power-Down
Current—TTL Inputs
Max. V
DD
, Device Deselected,
V
IN
≥
V
IH
or V
IN
≤
V
IL
f = f
MAX
= 1/t
CYC
6-ns cycle, 166 MHz
7.5-ns cycle, 133 MHz
10-ns cycle, 100 MHz
5
420
375
325
150
125
115
10
Test Conditions
Min.
3.135
2.375
2.4
2.0
0.4
0.7
V
DD
+ 0.3V
V
DD
+ 0.3V
0.8
0.7
5
Max.
3.6
3.6
Unit
V
V
V
V
V
V
V
V
V
V
µA
µA
µA
µA
µA
µA
mA
mA
mA
mA
mA
mA
mA
Input Current of MODE Input = V
SS
Input = V
DDQ
Input Current of ZZ
I
OZ
I
DD
Output Leakage
Current
V
DD
Operating Supply
Current
Input = V
SS
Input = V
DDQ
GND
≤
V
I
≤
V
DDQ,
Output Disabled
V
DD
= Max., I
OUT
= 0 mA,
f = f
MAX
= 1/t
CYC
I
SB2
Automatic CS
Max. V
DD
, Device Deselected,
Power-Down
V
IN
≤
0.3V or V
IN
> V
DDQ
– 0.3V,
Current—CMOS Inputs f = 0
Automatic CS
Max. V
DD
, Device Deselected, or
Power-Down
V
IN
≤
0.3V or V
IN
> V
DDQ
– 0.3V
Current—CMOS Inputs f = f
MAX
= 1/t
CYC
Automatic CS
Power-Down
Current—TTL Inputs
Max. V
DD
, Device Deselected,
V
IN
≥
V
IH
or V
IN
≤
V
IL
, f = 0
6-ns cycle, 166 MHz
7.5-ns cycle, 133 MHz
10-ns cycle, 100 MHz
I
SB3
120
95
85
18
mA
mA
mA
mA
I
SB4
Capacitance
[9]
Parameter
C
IN
C
CLK
C
I/O
Description
Input Capacitance
Clock Input Capacitance
Input/Output Capacitance
Test Conditions
T
A
= 25°C, f = 1 MHz,
V
DD
= 3.3V,
V
DDQ
= 3.3V
Max.
4
4
4
Unit
pF
pF
pF
Note:
9. Tested initially and after any design or process changes that may affect these parameters.
Document #: 38-05247
Page 8 of 17
WEIDA [ WEIDA SEMICONDUCTOR, INC. ]
