LTC2153-12
applicaTions inForMaTion
Digital Output Test Patterns
Nap Mode
To allow in-circuit testing of the digital interface to the
A/D, there are several test modes that force the A/D data
outputs (OF, D11 to D0) to known values:
In nap mode the A/D core is powered down while the
internal reference circuits stay active, allowing faster
wake-up. Recovering from nap mode requires at least
100 clock cycles.
All 1s: All outputs are 1
All 0s: All outputs are 0
Wake-up time from nap mode is guaranteed only if the
clock is kept running, otherwise sleep mode wake-up
conditions apply.
Alternating: Outputs change from all 1s to all 0s on
alternating samples
Nap mode is enabled by setting register A1 in the serial
programming mode.
Checkerboard: Outputs change from 1010101010101
to 0101010101010 on alternating samples.
DEVICE PROGRAMMING MODES
The digital output test patterns are enabled by serially
programming mode control register A4. When enabled,
the test patterns override all other formatting modes:
2’s complement, randomizer, alternate-bit polarity.
The operating modes of the LTC2153-12 can be pro-
grammed by either a parallel interface or a simple serial
interface. The serial interface has more flexibility and
can program all available modes. The parallel interface
is more limited and can only program some of the more
commonly used modes.
Output Disable
The digital outputs may be disabled by serially program-
ming mode control register A3. All digital outputs includ-
ing OF and CLKOUT are disabled. The high impedance
disabled state is intended for long periods of inactivity,
it is not designed for multiplexing the data bus between
multiple converters.
Parallel Programming Mode
To use the parallel programming mode, PAR/SER should
be tied to V . The CS, SCK and SDI pins are binary logic
DD
inputs that set certain operating modes. These pins can
be tied to V or ground, or driven by 1.8V, 2.5V, or 3.3V
DD
Sleep Mode
CMOS logic. Table 2 shows the modes set by CS, SCK
and SDI.
The A/D may be placed in sleep mode to conserve power.
In sleep mode the entire A/D converter is powered down,
resulting in < 5mW power consumption. If the encode
input signal is not disabled, the power consumption will
behigher(upto5mWat310Msps).Sleepmodeisenabled
by mode control register A1 (serial programming mode),
or by SCK (parallel programming mode).
Table 2. Parallel Programming Mode Control Bits (PAR/SER = VDD
)
PIN
DESCRIPTION
CS
Clock Duty Cycle Stabilizer Control Bit
0 = Clock Duty Cycle Stabilizer Off
1 = Clock Duty Cycle Stabilizer On
Power Down Control Bit
SCK
SDI
0 = Normal Operation
The amount of time required to recover from sleep mode
1 = Sleep Mode (entire ADC is powered down)
LVDS Current Selection Bit
depends on the size of the bypass capacitor on V . For
REF
the suggested value in Figure 1, the A/D will stabilize after
0 = 3.5mA LVDS Current Mode
1 = 1.75mA LVDS Current Mode
0.1ms + 2500 • t where t is the period of the sampling
p
p
clock.
215312fa
For more information www.linear.com/LTC2153-12
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