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产品型号W27C020P-70的概述

芯片W27C020P-70的概述 W27C020P-70是一款广泛应用于嵌入式系统中的可编程只读存储器(EPROM)。它由Winbond Electronics Corporation制造,主要用于数据存储和代码存储等场合。由于其相对较低的容量和高可编程性,该芯片在早期计算机、嵌入式系统以及各种电子产品中得到了广泛应用。 这款芯片的容量为256Kbit,通常以32K字节为单位划分。芯片的工作电压为5V,并且通常允许通过热编程或紫外线擦写的过程进行数据的重写。这种灵活性使得W27C020P-70在开发和测试阶段颇受欢迎,尤其是对于那些需要频繁更新代码的应用。 芯片W27C020P-70的详细参数 芯片W27C020P-70的主要技术参数如下: - 容量:256Kbit(32KB) - 数据总线宽度:8位 - 编程电压:12.75V - 擦写电压:UV(紫外线) - 工作电压:4.5V至5...

产品型号W27C020P-70的Datasheet PDF文件预览

Preliminary W27C020  
256K ´ 8 ELECTRICALLY ERASABLE EPROM  
GENERAL DESCRIPTION  
The W27C020 is a high speed, low power Electrically Erasable and Programmable Read Only  
Memory organized as 262144 ´ 8 bits that operates on a single 5 volt power supply. The W27C020  
provides an electrical chip erase function.  
FEATURES  
· High speed access time:  
70/90/120 nS (max.)  
· +14V erase/+12V programming voltage  
· Fully static operation  
· Read operating current: 30 mA (max.)  
· All inputs and outputs directly TTL/CMOS  
· Erase/Programming operating current:  
compatible  
30 mA (max.)  
· Three-state outputs  
· Standby current: 1 mA (max.)  
· Single 5V power supply  
· Available packages: 32-pin 600 mil DIP and  
PLCC  
PIN CONFIGURATIONS  
BLOCK DIAGRAM  
Q0  
PGM  
CE  
Vcc  
Vpp  
A16  
A15  
A12  
A7  
32  
31  
30  
29  
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
1
OUTPUT  
BUFFER  
CONTROL  
.
PGM  
A17  
2
Q7  
OE  
3
A14  
A13  
A8  
4
5
A6  
6
A0  
.
A5  
A9  
7
32-pin DIP  
CORE  
DECODER  
A11  
A4  
8
ARRAY  
A3  
9
OE  
A17  
A2  
10  
11  
12  
13  
14  
A10  
A1  
CE  
Q7  
VCC  
A0  
GND  
VPP  
Q6  
Q5  
Q4  
Q3  
Q0  
Q1  
Q2  
GND  
18  
17  
15  
16  
PIN DESCRIPTION  
/
A
1
6
A
1
2
A
1
5
V
p
p
V
c
c
P
A
1
G
M 7  
SYMBOL  
DESCRIPTION  
Address Inputs  
Data Inputs/Outputs  
A0- A17  
Q0- Q7  
CE  
3
2
3
3
2
1
4
3
1
0
5
6
7
8
9
10  
11  
12  
13  
A7  
A6  
A5  
A4  
A3  
A2  
A1  
A0  
Q0  
29  
28  
27  
26  
25  
24  
23  
22  
21  
A14  
A13  
A8  
A9  
A11  
Chip Enable  
32-pin PLCC  
OE  
A10  
Output Enable  
Program Enable  
OE  
1
8
1
9
2
0
CE  
Q7  
1
7
1
4
1
5
1
6
PGM  
VPP  
Program/Erase Supply Voltage  
Power Supply  
Q
2
Q
1
G Q Q Q  
3 4 5  
Q
6
N
D
VCC  
GND  
Ground  
Publication Release Date: September 1998  
Revision A1  
- 1 -  
Preliminary W27C020  
FUNCTIONAL DESCRIPTION  
Read Mode  
Like conventional UVEPROMs, the W27C020 has two control functions, both of which produce data  
at the outputs.  
CE is for power control and chip select. OE controls the output buffer to gate data to the output pins.  
When addresses are stable, the address access time (TACC) is equal to the delay from CE to output  
(TCE), and data are available at the outputs TOE after the falling edge of OE, if TACC and TCE timings  
are met.  
Erase Mode  
The erase operation is the only way to change data from "0" to "1." Unlike conventional UVEPROMs,  
which use ultraviolet light to erase the contents of the entire chip (a procedure that requires up to half  
an hour), the W27C020 uses electrical erasure. Generally, the chip can be erased within 100 mS by  
using an EPROM writer with a special erase algorithm.  
Erase mode is entered when VPP is raised to VPE (14V), VCC = VCE (5V), CE = VIL, (0.8V or below  
but higher than GND), OE = VIH (2V or above but lower than VCC), A9 = VID (14V), A0 = VIL, and all  
other address pins equal VIL and data input pins equal VIH. Pulsing PGM low starts the erase  
operation.  
Erase Verify Mode  
After an erase operation, all of the bytes in the chip must be verified to check whether they have been  
successfully erased to "1" or not. The erase verify mode automatically ensures a substantial erase  
margin. This mode will be entered after the erase operation if VPP = VPE (14V), CE = VIL, and OE =  
VIL, PGM = VIH.  
Program Mode  
Programming is performed exactly as it is in conventional UVEPROMs, and programming is the only  
way to change cell data from "1" to "0." The program mode is entered when VPP is raised to VPP  
(12V), VCC = VCP (5V), CE = VIL, OE = VIH, the address pins equal the desired addresses, and the  
input pins equal the desired inputs. Pulsing PGM low starts the programming operation.  
Program Verify Mode  
All of the bytes in the chip must be verified to check whether they have been successfully  
programmed with the desired data or not. Hence, after each byte is programmed, a program verify  
operation should be performed. The program verify mode automatically ensures a substantial  
program margin. This mode will be entered after the program operation if VPP = VPP (12V), CE = VIL,  
OE = VIL, and PGM = VIH.  
Erase/Program Inhibit  
Erase or program inhibit mode allows parallel erasing or programming of multiple chips with different  
data. When CE = VIH, erasing or programming of non-target chips is inhibited, so that except for the  
CE, the W27C020 may have common inputs.  
- 2 -  
Preliminary W27C020  
Standby Mode  
The standby mode significantly reduces VCC current. This mode is entered when CE = VIH. In  
standby mode, all outputs are in a high impedance state, independent of OE and PGM.  
Two-line Output Control  
Since EPROMs are often used in large memory arrays, the W27C020 provides two control inputs for  
multiple memory connections. Two-line control provides for lowest possible memory power  
dissipation and ensures that data bus contention will not occur.  
System Considerations  
EPROM power switching characteristics require careful device decoupling. System designers are  
concerned with three supply current issues: standby current levels (ISB), active current levels (ICC),  
and transient current peaks produced by the falling and rising edges of CE. Transient current  
magnitudes depend on the device output's capacitive and inductive loading. Two-line control and  
proper decoupling capacitor selection will suppress transient voltage peaks. Each device should have  
a 0.1 mF ceramic capacitor connected between its VCC and GND. This high frequency, low inherent-  
inductance capacitor should be placed as close as possible to the device. Additionally, for every eight  
devices, a 4.7 mF electrolytic capacitor should be placed at the array's power supply connection  
between VCC and GND. The bulk capacitor will overcome voltage slumps caused by PC board trace  
inductances.  
TABLE OF OPERATING MODES  
VPP = 12V, VPE = 14V, VHH = 12V, VCP = 5V, VCE = 5V, VID = 14V, X = VIH or VIL  
MODE  
PINS  
A0  
A9  
VCC  
VPP  
OUTPUTS  
CE  
OE  
PGM  
X
Read  
VIL  
VIL  
VIL  
VIH  
X
X
X
X
X
VCC VCC DOUT  
VCC VCC High Z  
VCC VCC High Z  
VCC VCC High Z  
Output Disable  
Standby (TTL)  
Standby (CMOS)  
Program  
X
VIH  
X
X
X
X
X
X
X
VCC ±0.3V  
VIL  
VIH  
VIL  
X
VIL  
VIH  
X
X
X
VCP  
VCC  
VPP DIN  
Program Verify  
Program Inhibit  
Erase  
VIL  
X
X
VPP DOUT  
VIH  
X
X
VCP VPP High Z  
VIL  
VIH  
VIL  
X
VIL  
VIH  
X
VIL  
X
VID  
X
VCE VPE FF (Hex)  
Erase Verify  
Erase Inhibit  
VIL  
VCC  
VPE DOUT  
VIH  
X
X
VCE VPE High Z  
Product Identifier-  
manufacturer  
VIL  
VIL  
X
VIL  
VHH VCC VCC DA (Hex)  
Product Identifier-device  
VIL  
VIL  
X
VIH  
VHH VCC VCC 85 (Hex)  
Publication Release Date: September 1998  
Revision A1  
- 3 -  
Preliminary W27C020  
DC CHARACTERISTICS  
Absolute Maximum Ratings  
PARAMETER  
RATING  
-55 to +125  
UNIT  
°C  
Ambient Temperature with Power Applied  
Storage Temperature  
-65 to +125  
°C  
Voltage on all Pins with Respect to Ground Except VCC, VPP  
and A9 Pins  
-0.5 to VCC +0.5  
V
Voltage on VCC Pin with Respect to Ground  
Voltage on VPP Pin with Respect to Ground  
Voltage on A9 Pin with Respect to Ground  
-0.5 to +7  
-0.5 to +14.5  
-0.5 to +14.5  
V
V
V
Note: Exposure to conditions beyond those listed under Absolute Maximum Ratings may adversely affect the life and reliability of the  
device.  
DC Erase Characteristics  
(TA = 25° C ±5° C, VCC = 5.0V ±5%, VHH = 14V)  
PARAMETER  
SYM.  
CONDITIONS  
LIMITS  
UNI  
T
MIN.  
-10  
-
TYP. MAX.  
Input Load Current  
VCC Erase Current  
ILI  
VIN = VIL or VIH  
-
-
10  
30  
mA  
ICP  
mA  
CE = VIL, OE = VIH,  
PGM = VIL, A9 = VHH  
VPP Erase Current  
IPP  
-
-
30  
mA  
CE = VIL, OE = VIH,  
PGM = VIL, A9 = VHH  
Input Low Voltage  
VIL  
-
-0.3  
2.4  
-
-
0.8  
5.5  
V
V
V
V
V
V
V
Input High Voltage  
VIH  
-
Output Low Voltage (Verify)  
Output High Voltage (Verify)  
A9 Erase Voltage  
VOL  
VOH  
VID  
IOL = 2.1 mA  
-
-
0.45  
-
IOH = -0.4 mA  
2.4  
-
-
-
-
13.75  
13.75  
4.5  
14.0  
14.0  
5.0  
14.25  
14.25  
5.5  
VPP Erase Voltage  
VPE  
VCE  
VCC Supply Voltage (Erase)  
Note: VCC must be applied simultaneously or before VPP and removed simultaneously or after VPP.  
- 4 -  
Preliminary W27C020  
CAPACITANCE  
(VCC = 5V, TA = 25° C, f = 1 MHz)  
PARAMETER  
Input Capacitance  
SYMBOL  
CIN  
CONDITIONS  
VIN = 0V  
MAX.  
6
UNIT  
pF  
Output Capacitance  
COUT  
VOUT = 0V  
12  
pF  
AC CHARACTERISTICS  
AC Test Conditions  
PARAMETER  
CONDITIONS  
70 nS  
90/120 nS  
Input Pulse Levels  
0 to 3.0V  
5 nS  
0.45V to 2.4V  
10 nS  
Input Rise and Fall Times  
Input and Output Timing Reference Level 1.5V/1.5V  
0.8V/2.0V  
Output Load  
CL = 30 pF,  
CL = 100 pF,  
IOH/IOL = -0.4 mA/2.1 mA IOH/IOL = -0.4 mA/2.1 mA  
AC Test Load and Waveforms  
+1.3V  
(IN914)  
3.3K ohm  
D
OUT  
100 pF for 90/120 nS (Including Jig and Scope)  
30 pF for 70 nS (Including Jig and Scope)  
Input/Output  
Test Points  
Test Points  
2.4V  
For 90/120 nS  
0.45V  
2.0V  
0.8V  
2.0V  
0.8V  
Test Point  
1.5V  
Test Point  
3.0V  
For 70 nS  
0V  
1.5V  
Publication Release Date: September 1998  
Revision A1  
- 5 -  
Preliminary W27C020  
READ OPERATION DC CHARACTERISTICS  
(Vcc = 5.0V ±5%)  
PARAMETER  
SYM.  
CONDITIONS  
LIMITS  
UNIT  
MIN.  
-5  
TYP.  
MAX.  
5
Input Load Current  
ILI  
VIN = 0V to VCC  
-
-
-
mA  
mA  
Output Leakage Current  
ILO  
ISB  
VOUT = 0V to VCC  
-10  
-
10  
Standby VCC Current  
(TTL input)  
1.0  
mA  
CE = VIH  
Standby VCC Current  
(CMOS input)  
ISB1  
ICC  
-
-
5
-
100  
30  
mA  
CE = VCC ±0.2V  
VCC Operating Current  
mA  
CE = VIL  
IOUT = 0 mA  
f = 5 MHz  
VPP Operating Current  
Input Low Voltage  
IPP  
VPP = VCC  
-
-0.3  
2.2  
-
-
-
-
-
-
10  
0.8  
mA  
V
VIL  
-
Input High Voltage  
Output Low Voltage  
Output High Voltage  
VPP Operating Voltage  
VIH  
VOL  
VOH  
VPP  
-
IOL = 2.1 mA  
IOH = -0.4 mA  
-
VCC +0.5  
0.45  
-
V
-
V
2.4  
V
VCC -0.7  
VCC  
V
READ OPERATION AC CHARACTERISTICS  
(VCC = 5.0V ±5%, for 70, 90 and 120 nS; TA = 0 to 70° C)  
PARAMETER  
SYM.  
W27C020-70  
W27C020-90  
W27C020-12  
UNIT  
MIN.  
MAX.  
-
MIN.  
MAX.  
-
MIN.  
MAX.  
-
Read Cycle Time  
TRC  
TCE  
TACC  
TOE  
70  
-
90  
-
120  
nS  
nS  
nS  
nS  
Chip Enable Access Time  
Address Access Time  
70  
90  
-
-
-
120  
120  
55  
-
70  
-
90  
Output Enable Access  
Time  
-
30  
-
40  
TDF  
TOH  
-
25  
-
-
25  
-
-
30  
-
nS  
nS  
OE High to High-Z Output  
Output Hold from Address  
Change  
0
0
0
Note: VCC must be applied simultaneously or before VPP and removed simultaneously or after VPP.  
- 6 -  
Preliminary W27C020  
DC PROGRAMMING CHARACTERISTICS  
(VCC = 5.0V ±5%, TA = 25° C ±5° C)  
PARAMETER  
SYM.  
CONDITIONS  
LIMITS  
UNIT  
MIN.  
TYP. MAX.  
Input Load Current  
ILI  
VIN = VIL or VIH  
-
-
-
-
±10  
mA  
VCC Program Current  
ICP  
30  
mA  
CE = VIL, OE = VIH,  
PGM = VIL  
VPP Program Current  
IPP  
-
-
30  
mA  
CE = VIL, OE = VIH,  
PGM = VIL  
Input Low Voltage  
VIL  
-
-0.3  
2.4  
-
0.8  
5.5  
0.45  
-
V
V
V
V
V
V
V
Input High Voltage  
VIH  
-
-
Output Low Voltage (Verify)  
Output High Voltage (Verify)  
A9 Silicon I. D. Voltage  
VPP Program Voltage  
VOL  
VOH  
VID  
IOL = 2.1 mA  
-
-
-
IOH = -0.4 mA  
2.4  
-
-
-
11.5  
11.75  
4.5  
12.0  
12.5  
VPP  
VCP  
12.0 12.25  
VCC Supply Voltage (Program)  
5.0  
5.5  
AC PROGRAMMING/ERASE CHARACTERISTICS  
(VCC = 5.0V ±5%, TA = 25° C ±5° C)  
PARAMETER  
SYM.  
LIMITS  
UNIT  
MIN.  
2.0  
2.0  
2.0  
95  
95  
2.0  
2.0  
-
TYP.  
MAX.  
VPP Setup Time  
TVPS  
TAS  
-
-
mS  
mS  
mS  
mS  
mS  
Address Setup Time  
Data Setup Time  
-
-
TDS  
-
-
TPWP  
TPWE  
TDH  
100  
105  
PGM Program Pulse Width  
100  
105  
PGM Erase Pulse Width  
Data Hold Time  
-
-
-
-
-
-
-
-
mS  
mS  
nS  
nS  
TOES  
TOEV  
TDFP  
TAH  
-
OE Setup Time  
150  
Data Valid from OE  
OE High to Output High Z  
0
130  
0
-
-
-
mS  
mS  
mS  
Address Hold Time after PGM High  
Address Hold Time (Erase)  
TAHE  
TCES  
2.0  
2.0  
CE Setup Time  
Note: VCC must be applied simultaneously or before VPP and removed simultaneously or after VPP.  
Publication Release Date: September 1998  
Revision A1  
- 7 -  
Preliminary W27C020  
TIMING WAVEFORMS  
AC Read Waveform  
V
IH  
Address  
Address Valid  
V
IL  
V
IH  
CE  
V
IL  
TCE  
V
IH  
OE  
T
DF  
V
IL  
T
OE  
T
OH  
T
ACC  
High Z  
Outputs  
Valid Output  
High Z  
Erase Waveform  
Read  
Manufacturer  
Read  
Device  
Blank Check  
Read Verify  
Erase Verify  
SID  
A9 = 12.0V  
SID  
Chip Erase  
A9 = 14.0V  
Others = V  
IL  
Others = V  
IL  
V
IH  
Address  
Stable  
Address  
Stable  
A0=V  
IH  
Address  
Stable  
Address  
Data  
A0 = V  
IL  
Others=V  
IL  
V
IL  
T
T
AS  
T
AS  
AS  
T
AHC  
T
ACC  
T
DFP  
D
OUT  
D
DA  
01  
OUT  
D
OUT  
Data All One  
T
DS  
T
DH  
T
AH  
14.0V  
5.0V  
5V  
T
VPS  
V
PP  
T
CE  
V
IH  
CE  
V
IL  
T
OES  
T
OE  
T
OE  
T
OE  
V
IH  
OE  
V
IL  
T
OEV  
T
PWE  
T
CES  
PGM  
- 8 -  
Preliminary W27C020  
Timing Waveforms, continued  
Programming Waveform  
Program  
Verify  
Read  
Verify  
Program  
V
IH  
Address Stable  
Address Valid  
Address Stable  
Address  
Data  
V
IL  
T
DFP  
T
AS  
T
ACC  
D
D
OUT  
D
OUT  
OUT  
Data In Stable  
T
AH  
T
DS  
T
DH  
12.0V  
V
PP  
5V  
5.0V  
T
VPS  
T
CES  
V
IH  
CE  
V
IL  
T
OE  
V
IH  
OE  
V
IL  
T
OES  
T
OEV  
V
IH  
T
PWP  
PGM  
V
IL  
Publication Release Date: September 1998  
Revision A1  
- 9 -  
Preliminary W27C020  
SMART PROGRAMMING ALGORITHM  
Start  
Address = First Location  
Vcc = 5V  
Vpp = 12V  
X = 0  
Program One 100 S Pulse  
m
Increment X  
Yes  
X = 25?  
No  
Fail  
Verify  
One Byte  
Fail  
Verify  
One Byte  
Pass  
Pass  
No  
Last  
Address?  
Increment  
Address  
Yes  
Vcc = 5V  
Vpp = 5V  
Compare  
All Bytes to  
Fail  
Original Data  
Pass  
Fail  
Device  
Pass  
Device  
- 10 -  
Preliminary W27C020  
SMART ERASE ALGORITHM  
Start  
X = 0  
Vcc = 5V  
Vpp = 14V  
IL  
A9 = 14V; A0 = V  
Chip Erase 100 mS Pulse  
Address = First Location  
Increment X  
No  
Fail  
Erase  
Verify  
X = 20?  
Pass  
Yes  
No  
Increment  
Address  
Last  
Address?  
Yes  
Vcc = 5V  
Vpp = 5V  
Compare  
All Bytes to  
FFs (HEX)  
Fail  
Pass  
Pass  
Device  
Fail  
Device  
Publication Release Date: September 1998  
Revision A1  
- 11 -  
Preliminary W27C020  
ORDERING INFORMATION  
PART NO.  
ACCESS  
TIME  
POWER SUPPLY  
CURRENT MAX.  
(mA)  
STANDBY VCC  
CURRENT MAX.  
PACKAGE  
(nS)  
(mA)  
W27C20-70  
70  
90  
30  
30  
30  
30  
30  
30  
100  
100  
100  
100  
100  
100  
600 mil DIP  
600 mil DIP  
600 mil DIP  
32-pin PLCC  
32-pin PLCC  
32-pin PLCC  
W27C020-90  
W27C020-12  
W27C020P-70  
W27C020P-90  
W27C020P-12  
120  
70  
90  
120  
Notes:  
1. Winbond reserves the right to make changes to its products without prior notice.  
2. Purchasers are responsible for performing appropriate quality assurance testing on products intended for use in  
applications where personal injury might occur as a consequence of product failure.  
- 12 -  
Preliminary W27C020  
PACKAGE DIMENSIONS  
32-pin P-DIP  
Dimension in mm  
Min. Nom. Max. Min. Nom. Max.  
Dimension in Inches  
Symbol  
5.33  
0.210  
A
0.010  
0.150  
0.25  
3.81  
0.41  
1.22  
0.20  
A1  
A2  
B
0.155 0.160  
3.94  
0.46  
1.27  
0.25  
41.91  
4.06  
0.56  
0.016 0.018  
0.050  
0.022  
0.054  
1.37  
0.048  
B
c
1
0.36  
0.008 0.010 0.014  
1.650 1.660  
D
17  
32  
42.16  
15.49  
D
E
E
0.590 0.600 0.610 14.99 15.24  
13.84 13.97 14.10  
0.555  
0.110  
0.545 0.550  
0.090 0.100  
1
2.29  
3.05  
0
2.54  
3.30  
2.79  
e 1  
L
E1  
0.140  
15  
0.120 0.130  
0
3.56  
15  
a
0.630  
0.670 16.00  
0.085  
17.02  
0.650  
16.51  
eA  
S
2.16  
16  
1
Notes:  
E
S
1. Dimensions D Max. & S include mold flash or tie bar burr  
2. Dimension E1 does not include interlead flash.  
3. Dimensions D & E1 include mold mismatch and are  
determined at the mold parting line.  
c
2
A
A
A1  
Base Plane  
4. Dimension B1 does not include dambar protrusion/intrusi  
5. Controlling dimension: Inches.  
6. General appearance spec. should be based on final visu  
inspection spec.  
L
Seating Plane  
B
e1  
e A  
a
B1  
32-Lead PLCC  
H E  
E
4
1
32  
30  
Dimension in Inches  
Dimension in mm  
Symbol  
Min. Nom. Max. Min. Nom. Max.  
5
29  
0.140  
3.56  
A
A
A
b
b
c
D
E
e
GD  
G
HD  
H
0.020  
0.105  
0.026  
0.016  
0.008  
0.50  
2.67  
0.66  
0.41  
0.20  
1
2
1
0.110  
0.028  
0.018  
0.010  
0.550  
0.450  
0.050  
0.510  
0.410  
0.590  
0.490  
0.090  
0.115  
0.032  
0.022  
0.014  
2.80  
0.71  
2.93  
0.81  
0.56  
0.35  
0.46  
G
D
0.25  
D
H
D
0.547  
0.447  
0.044  
0.490  
0.390  
0.585  
0.485  
0.075  
0.553  
0.453  
0.056  
0.530  
0.430  
0.595  
0.495  
0.095  
0.004  
13.89  
11.35  
1.12  
14.05  
11.51  
1.42  
13.97  
11.43  
1.27  
12.95  
12.45  
9.91  
13.46  
10.92  
15.11  
12.57  
2.41  
10.41  
14.99  
12.45  
2.29  
E
21  
13  
14.86  
12.32  
1.91  
E
L
y
14  
c
20  
0.10  
°
0
°
10  
°
0
°
10  
q
L
Notes:  
A2  
A
1. Dimensions D & E do not include interlead flash.  
2. Dimension b1 does not include dambar protrusion/intrusion.  
3. Controlling dimension: Inches.  
q
e
1
b
A
4. General appearance spec. should be based on final  
visual inspection sepc.  
b 1  
Seating Plane  
y
G
E
Publication Release Date: September 1998  
Revision A1  
- 13 -  
Preliminary W27C020  
VERSION HISTORY  
VERSION  
DATE  
Sep. 1998  
PAGE  
DESCRIPTION  
A1  
Initial Issued  
Winbond Electronics (H.K.) Ltd.  
Winbond Electronics North America Corp.  
Headquarters  
Rm. 803, World Trade Square, Tower II, Winbond Memory Lab.  
No. 4, Creation Rd. III,  
Science-Based Industrial Park,  
Hsinchu, Taiwan  
TEL: 886-3-5770066  
FAX: 886-3-5796096  
123 Hoi Bun Rd., Kwun Tong,  
Winbond Microelectronics Corp.  
Winbond Systems Lab.  
2727 N. First Street, San Jose,  
CA 95134, U.S.A.  
Kowloon, Hong Kong  
TEL: 852-27513100  
FAX: 852-27552064  
http://www.winbond.com.tw/  
Voice & Fax-on-demand: 886-2-7197006  
TEL: 408-9436666  
FAX: 408-5441798  
Taipei Office  
11F, No. 115, Sec. 3, Min-Sheng East Rd.,  
Taipei, Taiwan  
TEL: 886-2-7190505  
FAX: 886-2-7197502  
Note: All data and specifications are subject to change without notice.  
- 14 -  
配单直通车
W27C020P-70产品参数
型号:W27C020P-70
是否Rohs认证:不符合
生命周期:Obsolete
IHS 制造商:WINBOND ELECTRONICS CORP
零件包装代码:QFJ
包装说明:PLASTIC, LCC-32
针数:32
Reach Compliance Code:not_compliant
ECCN代码:3A991.B.1.B.1
HTS代码:8542.32.00.51
风险等级:5.86
Is Samacsys:N
最长访问时间:70 ns
命令用户界面:NO
数据轮询:NO
JESD-30 代码:R-PQCC-J32
JESD-609代码:e0
长度:13.97 mm
内存密度:2097152 bit
内存集成电路类型:EEPROM
内存宽度:8
功能数量:1
端子数量:32
字数:262144 words
字数代码:256000
工作模式:ASYNCHRONOUS
最高工作温度:70 °C
最低工作温度:
组织:256KX8
封装主体材料:PLASTIC/EPOXY
封装代码:QCCJ
封装等效代码:LDCC32,.5X.6
封装形状:RECTANGULAR
封装形式:CHIP CARRIER
并行/串行:PARALLEL
峰值回流温度(摄氏度):NOT SPECIFIED
电源:5 V
编程电压:12 V
认证状态:Not Qualified
座面最大高度:3.56 mm
最大待机电流:0.0001 A
子类别:EEPROMs
最大压摆率:0.03 mA
最大供电电压 (Vsup):5.25 V
最小供电电压 (Vsup):4.75 V
标称供电电压 (Vsup):5 V
表面贴装:YES
技术:CMOS
温度等级:COMMERCIAL
端子面层:Tin/Lead (Sn/Pb)
端子形式:J BEND
端子节距:1.27 mm
端子位置:QUAD
处于峰值回流温度下的最长时间:NOT SPECIFIED
切换位:NO
宽度:11.43 mm
Base Number Matches:1
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