X4C105
Absolute Maximum Ratings
Thermal Information
Temperature Under Bias . . . . . . . . . . . . . . . . . . . . .-65°C to +135°C
Storage temperature . . . . . . . . . . . . . . . . . . . . . . . .-65°C to +150°C
Voltage on any Pin with Respect to GND . . . . . . . . . . -1.0V to 7.0V
DC Output Current. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5mA
Thermal Resistance (Typical, Note 1)
JA (°C/W)
110
20 Lead TSSOP. . . . . . . . . . . . . . . . . . . . . . . . . . . .
CAUTION: Do not operate at or near the maximum ratings listed for extended periods of time. Exposure to such conditions may adversely impact product reliability and
result in failures not covered by warranty.
NOTE:
1. JA is measured with the component mounted on a high effective thermal conductivity test board in free air. See Tech Brief TB379 for details.
Electrical Specifications VCC = 3.0V to 3.6V at -40°C to +85°C, unless otherwise specified. Parameters with MIN and/or MAX limits are
100% tested at +25°C, unless otherwise specified. Temperature limits established by characterization and are
not production tested.
SYMBOL
PARAMETER
TEST CONDITIONS
MIN
MAX
UNIT
I
CC1 (Note 2) Active Supply Current Serial
VIL = VCC x 0.1, VIH = VCC x 0.9, fSCL = 400kHz, SDA = Read/Write
2.0
mA
Read or Serial Write (Does Not Operation, CE, OE, WE, D0 - D3 = VIH; O0 - O3, RESET = Open
Include the Nonvolatile Store
Operation)
CAP is tied to VCC; VCC > VTRIP
I
I
CC2 (Note 2) Average Active Supply Current VIL = VCC x 0.1, VIH = VCC x 0.9, SCL, SDA = VIH; WP, S1, S2 = VIL,
During Serial Nonvolatile Store CE, OE, WE, D0 - D3 = VIH; O0 - O3, RESET = Open CAP is tied to
3.0
3.0
3.0
3.0
50
mA
mA
mA
mA
µA
Operation
VCC. Test during the N.V. write cycle.
CC3 (Note 2) Active Supply Current Volatile
NOVRAM Read
VIL = VCC x 0.1, VIH = VCC x 0.9, SCL, SDA = VIH; WP, S1, S2 = VIL,
WE = VIH; CE, OE = VIL, D0 - D3, O0 - O3, RESET = Open CAP is
tied to VCC; VCC > VTRIP
ICC4 (Note 2) Active Supply Current Volatile
NOVRAM Write
VIL = VCC x 0.1, VIH = VCC x 0.9, SCL, SDA = VIH; WP, S1, S2 =VIL,
OE = VIH; CE, WE = VIL,D0-D3 = VIL or VIH, O0 - O3, RESET = Open
CAP is tied to VCC; VCC > VTRIP
I
I
CC5 (Note 2) Average Active Supply Current
VIL = VCC x 0.1, VIH = VCC x 0.9, SCL, SDA, VIH; WP, S1, S2 = VIL,
Over NOVRAM Store or Active WE, CE, OE = VIH; D0 - D3, O0 - O3, RESET = Open CAP is tied
Current During Recall
to VCC, VCC < VTRIP for Store; VCC > VTRIP for Recall
SB1 (Note 2) Standby Current
VIL = VCC x 0.1, VIH = VCC x 0.9, SCL, SDA, CE, WE, OE, D0 - D3,
= VIH, WP = VIL, O0 - O3,RESET = Open; CAP is tied to VCC
ILI
Input Leakage Current
Output Leakage Current
VIN = GND to VCC
10
10
µA
µA
V
ILO
VSDA = GND to VCC; Device is in Standby (Note 3)
VIL (Note 4) Input LOW voltage
IH (Note 4) Input HIGH voltage
-0.5
VCC x 0.3
V
VCC x 0.7 VCC + 0.5
0.05 x VCC
0.4
V
VHYS
VOL
Schmitt Trigger Input Hysteresis
V
Output LOW Voltage
Output HIGH Voltage
IOL = 2.0mA, VCC = 3.3V
IOH = -1mA, VCC = 3.3V
V
VOH
VCC - 0.4
V
NOTES:
2. The device enters the active state after any start, and remains active until: 9 clock cycles later if the device select bits in the slave address byte
are incorrect; 200ns after a stop ending a read operation; or tWC after a stop ending a write operation.
3. The device goes into standby: 200ns after any stop, except those that initiate a high voltage write cycle; tWC after a stop that initiates a high voltage
cycle; or 9 clock cycles after any start that is not followed by the correct device select bits in the slave address byte.
4. VIL min and VIH max are for reference only and are not tested.
Capacitance TA = +25°C, f = 1.0 MHz, VCC = 3.0V to 3.6V.
SYMBOL
CI/O
PARAMETER
Input/Output Capacitance (SDA, D0 - D3, O0 - O3)
Input Capacitance (SCL, WP, CE, WE, OE, S1, S2)
TEST CONDITIONS
VI/O = 0V
TYP
8
UNIT
pF
CIN
VIN = 0V
6
pF
FN8124 Rev 2.00
July 3, 2008
Page 8 of 15