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AOT500 参数 Datasheet PDF下载

AOT500图片预览
型号: AOT500
PDF下载: 下载PDF文件 查看货源
内容描述: N沟道增强型场 [N-Channel Enhancement Mode Field]
分类和应用:
文件页数/大小: 7 页 / 883 K
品牌: FREESCALE [ Freescale ]
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AOT500L  
N-Channel Enhancement Mode Field  
Effect Transistor  
TYPICAL PROTECTION CHARACTERISTICS  
2.00  
Trench BV  
1.50  
1.00  
0.50  
0.00  
BVCLAMP  
D
+
Vz  
-
BVDSS(Z)  
R
+
-
30  
35  
40  
45  
G
+
V
DS (Volts)  
Fig 15: BVCLAMP Characteristic  
VPLATEAU  
This device uses built-in Gate to Source and Gate to Drain zener  
protection. While the Gate-Source zener protects against excessive  
VGS conditions, the Gate to Drain protection, clamps the VDS well  
below the device breakdown, preventing an avalanche condition  
within the MOSFET as a result of voltage over-shoot at the Drain  
electrode.  
S
-
It is designed to breakdown well before the device breakdown.  
During such an event, current flows through the zener clamp, which  
is situated internally between the Gate to Drain. This current flows at  
BVDSS(Z), building up the VGS internal to the device. When the  
current level through the zener reaches approximately 300mA, the  
VGS is approximately equal to VGS(PLATEAU), allowing significant  
channel conduction and thus clamping the Drain to Source voltage.  
The VGS needed to turn the device on is controlled with an internally  
lumped gate resistor R approximately equal to 10.  
60.00  
BVCLAMP25oC  
50.00  
40.00  
30.00  
20.00  
10.00  
0.00  
BVCLAMP 100oC  
VGS(PLATEAU)= 10x 300mA =3V  
It can also be said that the VDS during clamping is equal to:  
BVDSS = BVCLAMP + VGS(PLATEAU)  
0.00E+00 2.50E-06 5.00E-06 7.50E-06 1.00E-05  
Additional power loss associated with the protection circuitry can be  
considered negligible when compare to the conduction losses of the  
MOSFET itself;  
Time in Avalanche (Seconds)  
Fig 16: Unclamped Inductive Switching  
EX:  
PL=30µAmax x 16V=0.48mW (Zener leakage loss)  
Fig16: The built-in Gate to Drain clamp prevents the device from  
going into Avalanche by setting the clamp voltage well below the  
actual breakdown of the device. When the Drain to Gate voltage  
approaches the BV clamp, the internal Gate to Source voltage is  
charged up and channel conduction occurs, sinking the current  
safely through the device. The BVCLAMP is virtually temperature  
independent, providing even greater protection during normal  
operation.  
PL(rds)=102A x 6m=300mW (MOSFET loss)  
6/7  
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