WM2604
Production Data
ABSOLUTE MAXIMUM RATINGS
Absolute Maximum Ratings are stress ratings only. Permanent damage to the device may be caused by continuously operating at or
beyond these limits. Device functional operating limits and guaranteed performance specifications are given under Electrical
Characteristics at the test conditions specified
ESD Sensitive Device. This device is manufactured on a CMOS process. It is therefore generically susceptible to
damage from excessive static voltages. Proper ESD precautions must be taken during handling and storage of this
device.
CONDITION
Supply voltages, AVDD to AGND, DVDD to DGND
Supply voltage differences, AVDD to DVDD
Digital input voltage
Reference input voltage
Operating temperature range, T
A
Storage temperature
Lead temperature 1.6mm (1/16 inch) soldering for 10 seconds
WM2604C
WM2604I
-2.8V
-0.3V
-0.3V
0°C
-40°C
-65°C
MIN
MAX
7V
2.8V
DVDD + 0.3V
AVDD + 0.3V
70°C
85°C
150°C
260°C
RECOMMENDED OPERATING CONDITIONS
PARAMETER
Supply voltage
High-level digital input voltage
Low-level digital input voltage
Reference voltage to REFINAB,
REFINCD
Load resistance
Load capacitance
Serial clock rate
Operating free-air temperature
SYMBOL
AVDD, DVDD
V
IH
V
IL
V
REF
R
L
C
L
f
SCLK
T
A
WM2604CDT
WM2604IDT
0
-40
DVDD = 2.7V to 5.5V
DVDD = 2.7V to 5.5V
See Note
2
10
100
20
70
85
TEST CONDITIONS
MIN
2.7
2
0.8
AVDD - 1.5
TYP
MAX
5.5
UNIT
V
V
V
V
kΩ
pF
MHz
°C
°C
Note:
Reference voltages greater than AVDD/2 will cause output saturation for large DAC codes.
WOLFSON MICROELECTRONICS LTD
PD Rev 1.0 June 99
3