WM2604
Production Data
Test Conditions:
R
L
= 10kΩ, C
L
= 100pF. AVDD = DVDD = 5V
±
10%, V
REF
= 2.048V and AVDD = DVDD = 3V
±
10%, V
REF
= 1.024V over
recommended operating free-air temperature range (unless noted otherwise).
PARAMETER
Reference
Reference input resistance
Reference input capacitance
Reference feedthrough
Reference input bandwidth
R
REFIN
C
REFIN
V
REF
= 1V
PP
at 1kHz
+ 1.024V dc, DAC code 0
V
REF
= 0.2V
PP
+ 1.024V dc
DAC code 512
Slow
Fast
Digital Inputs
High level input current
Low level input current
Input capacitance
Notes:
1.
Integral non-linearity
(INL) is the maximum deviation of the output from the line between zero and full scale (excluding the effects of
zero code and full scale errors).
2.
Differential non-linearity
(DNL) is the difference between the measured and ideal 1LSB amplitude change of any adjacent two codes. A
guarantee of monotonicity means the output voltage changes in the same direction (or remains constant) as a change in digital input code.
3.
Zero code error
is the voltage output when the DAC input code is zero.
4.
Gain error
is the deviation from the ideal full scale output excluding the effects of zero code error.
5.
Power supply rejection ratio
is measured by varying AVDD from 4.5V to 5.5V and measuring the proportion of this signal imposed on
the zero code error and the gain error.
6.
Zero code error
and
Gain error
temperature coefficients are normalised to full scale voltage.
7.
Output load regulation
is the difference between the output voltage at full scale with a 10kΩ load and 2kΩ load. It is expressed as a
percentage of the full scale output voltage with a 10kΩ load.
8.
I
DD
is measured while continuously writing code 512 to the DAC. For V
IH
< DVDD - 0.7V and V
IL
> 0.7V supply current will increase.
9.
Typical supply current
in power down mode is 10nA. Production test limits are wider for speed of test.
10.
Slew rate
results are for the lower value of the rising and falling edge slew rates.
11.
Settling time
is the time taken for the signal to settle to within 0.5LSB of the final measured value for both rising and falling edges. Limits
are ensured by design and characterisation, but are not production tested.
12.
SNR, SNRD, THD
and
SPFDR
are measured on a synthesised sinewave at frequency f
OUT
generated with a sampling frequency fs
.
I
IH
I
IL
C
I
Input voltage = DVDD
Input voltage = 0V
3
1
-1
µA
µA
pF
0.5
1
MHz
MHz
10
5
-75
MΩ
pF
dB
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNIT
WOLFSON MICROELECTRONICS LTD
PD Rev 1.0 June 99
5
WOLFSON [ WOLFSON MICROELECTRONICS PLC ]
