Clamped Inductive Switch Testing Fixture
tw
VGS(on)
90%
pulse duration
90%
50%
10%
Input (Vi)
50%
10%
856μH
+
800V
-
42.3μf
C2D10120D
10A, 1200V
SiC Schottky
VGS(off)
Input Pulse
Rise Time
Input Pulse
Fall Time
td(on)i
t
fi
td(off)i
tri
CMF20120D
D.U.T.
iD(on)
10%
10%
Output (iD)
90%
iD(off)
ton(i)
toff(i)
90%
Fig 11. Switching Waveform Test Circuit
Fig 12. Switching Test Waveform Times
trr
Ic
trr
Qrr= id dt
tx
∫
tx
10% Vcc
Vpk
Irr
10% Irr
Vcc
856μH
+
800V
-
42.3μf
CMF20120D
D.U.T.
Diode Recovery
Waveforms
CMF20120D
t2
Erec= id dt
t1
Diode Reverse
Recovery Energy
t1
t2
∫
Fig 13. Body Diode Recovery Waveform
Fig 14. Body Diode Recovery Test
11
CMF20120D Rev. -
CREE [ CREE, INC ]
