STK11C48
SRAM READ CYCLES #1 & #2
SYMBOLS
NO.
1
2
3
4
5
6
7
8
9
10
11
PARAMETER
#1, #2
t
ELQV
t
AVAVf
t
AVQVg
t
GLQV
t
AXQXg
t
ELQX
t
EHQZh
t
GLQX
t
GHQZh
t
ELICCHe
t
EHICCLd, e
Alt.
t
ACS
t
RC
t
AA
t
OE
t
OH
t
LZ
t
HZ
t
OLZ
t
OHZ
t
PA
t
PS
Chip Enable Access Time
Read Cycle Time
Address Access Time
Output Enable to Data Valid
Output Hold after Address Change
Chip Enable to Output Active
Chip Disable to Output Inactive
Output Enable to Output Active
Output Disable to Output Inactive
Chip Enable to Power Active
Chip Disable to Power Standby
0
25
0
10
0
35
5
5
10
0
13
0
45
25
25
10
5
5
13
0
15
MIN
MAX
25
35
35
15
5
5
15
MIN
MAX
35
45
45
20
MIN
MAX
45
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
STK11C48-25
(V
CC
= 5.0V + 10%)
STK11C48-35
STK11C48-45
UNITS
Note f: W must be high during SRAM READ cycles and low during SRAM WRITE cycles.
Note g: I/O state assumes E, G < V
IL
and W > V
IH
; device is continuously selected.
Note h: Measured
±
200mV from steady state output voltage.
SRAM READ CYCLE #1:
Address Controlled
t
AVAV
ADDRESS
5
t
AXQX
3
2
t
AVQV
DATA VALID
DQ (DATA OUT)
SRAM READ CYCLE #2:
E Controlled
t
AVAV
ADDRESS
t
ELQV
E
t
ELQX
t
EHQZ
7
6
1
2
t
EHICCL
11
G
4
t
GLQV
t
GHQZ
9
t
GLQX
DQ (DATA OUT)
t
ELICCH
I
CC
STANDBY
10
DATA VALID
8
ACTIVE
March 2006
3Document Control # ML0003 rev 0.2
SIMTEK [ SIMTEK CORPORATION ]
