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MT45W4MW16B 参数 Datasheet PDF下载

MT45W4MW16B图片预览
型号: MT45W4MW16B
PDF下载: 下载PDF文件 查看货源
内容描述: 64Mbit的PSRAM使用以及SRAM, VBGA54足迹 [64Mbit psram use as well as sram,VBGA54 footprint]
分类和应用: 静态存储器
文件页数/大小: 61 页 / 970 K
品牌: MICROTUNE [ MICROTUNE,INC ]
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64Mb: 4 Meg x 16 Async/Page/Burst CellularRAM 1.0 Memory
Bus Operating Modes
LB#/UB# Operation
The LB# enable and UB# enable signals support byte-wide data transfers. During READ
operations, the enabled byte(s) are driven onto the DQs. The DQs associated with a dis-
abled byte are put into a High-Z state during a READ operation. During WRITE opera-
tions, any disabled bytes will not be transferred to the RAM array and the internal value
will remain unchanged. During an asynchronous WRITE cycle, the data to be written is
latched on the rising edge of CE#, WE#, LB#, or UB#, whichever occurs first.
When both the LB# and UB# are disabled (HIGH) during an operation, the device will
disable the data bus from receiving or transmitting data. Although the device will seem
to be deselected, it remains in an active mode as long as CE# remains LOW.
Figure 11:
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
V
OH
V
OL
V
OH
V
OL
Additional WAIT states inserted to allow refresh completion.
D[0]
D[1]
D[2]
D[3]
DON’T CARE
High-Z
VALID
ADDRESS
Refresh Collision During READ Operation
CLK
A[21:0]
ADV#
CE#
OE#
WE#
LB#/UB#
WAIT
DQ[15:0]
UNDEFINED
Note:
Non-default BCR settings for refresh collision during READ operation: Latency code two
(three clocks); WAIT active LOW; WAIT asserted during delay.
PDF: 09005aef80be1fbd/Source: 09005aef80be2036
Burst CellularRAM_2.fm - Rev. G 10/05 EN
14
Micron Technology, Inc., reserves the right to change products or specifications without notice.
©2003 Micron Technology, Inc. All rights reserved.