t
E
– ENABLE PROPAGATION DELAY – ns
PULSE GEN.
Z
O
= 50
Ω
t
f
= t
r
= 5 ns
120
INPUT V
E
MONITORING NODE
HCPL-261A/261N
1
V
CC
8
0.1 µF
BYPASS
R
L
OUTPUT V
O
MONITORING
NODE
+5 V
90
V
CC
= 5 V
V
EH
= 3 V
V
EL
= 0 V
I
F
= 3.5 mA
t
ELH
, R
L
= 4 kΩ
60
t
ELH
, R
L
= 1 kΩ
30
t
ELH
, R
L
= 350
Ω
t
EHL
, R
L
= 350
Ω,
1k
Ω,
4 kΩ
0
-60 -40 -20
0
20
40
60
80 100
3.5 mA
I
F
2
7
3
6
*C
L
4
GND
5
T
A
– TEMPERATURE – °C
*C
L
IS APPROXIMATELY 15 pF WHICH INCLUDES
PROBE AND STRAY WIRING CAPACITANCE.
Figure 16. Typical Enable Propaga-
tion Delay vs. Temperature. HCPL-
261A/-261N/-061A/-061N Only.
3.0 V
1.5 V
INPUT
V
E
t
EHL
OUTPUT
V
O
t
ELH
1.5 V
Figure 15. Test Circuit for t
EHL
and t
ELH
.
OUTPUT POWER – P
S
, INPUT CURRENT – I
S
800
700
600
500
400
300
200
100
0
HCPL-261A/261N OPTION 060 ONLY
P
S
(mW)
I
S
(mA)
HCPL-261A/261N
1
V
CM
I
F
A
B
V
FF
3
6
GND 5
V
CC
8
0.1 µF
BYPASS
+5 V
2
7
350
Ω
OUTPUT V
O
MONITORING
NODE
4
0
25
50
75 100 125 150 175 200
T
S
– CASE TEMPERATURE – °C
PULSE GEN.
Z
O
= 50
Ω
+
_
V
CM
(PEAK)
V
CM
0V
5V
SWITCH AT A: I
F
= 0 mA
V
O
(min.)
SWITCH AT B: I
F
= 3.5 mA
V
O
V
O
(max.)
0.5 V
CM
L
Figure 18. Thermal Derating Curve,
Dependence of Safety Limiting Value
with Case Temperature per
VDE 0884.
CM
H
V
O
Figure 17. Test Circuit for Common Mode Transient Immunity and
Typical Waveforms.
1-177
OPTOCOUPLERS
AGILENT [ AGILENT TECHNOLOGIES, LTD. ]
