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XR88C681CP/40 参数 Datasheet PDF下载

XR88C681CP/40图片预览
型号: XR88C681CP/40
PDF下载: 下载PDF文件 查看货源
内容描述: CMOS双通道UART ( DUART ) [CMOS DUAL CHANNEL UART (DUART)]
分类和应用:
文件页数/大小: 99 页 / 1906 K
品牌: EXAR [ EXAR CORPORATION ]
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XR88C681
AC ELECTRICAL CHARACTERISTICS
1, 2, 3
(CONT’D)
Test Conditions:

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Typ.
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Unit
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Conditions
Clock Timing (Figure
56)
(Cont’d.)


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Transmitter Timing (Figure
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Notes
1.
Parameters are valid over the specified temperature and operating supply ranges. Typical values are 25C, V
CC
= 5V and typical
processing parameters.
2.
All voltages are referenced to ground (GND). For testing, input signal levels are 0.4V and 2.4V with a transition time of 20ns
maximum. All time measurements are referenced at input voltages of 0.8V and 2.0V as appropriate. See Figure 50.
3.
AC test conditions for outputs: CL = 50pF, RL = 2.7k• to V .
CC
4.
If

CS is used as the strobing input, this parameter defines the minimum high time between

CSs.
5.
Consecutive write operations to the same register require at least three edges of the X1 clock between writes.
6.
This specification imposes a 6 MHz maximum 68000 clock frequency if a read or write cycle follows immediately after the previous
read or write cycle. A higher 68000 clock can be used if this is not the case.
7.
This specification imposes a lower bound on

CS and

IACK low, guaranteeing that they will be low for at least one CLK period.
8.
The minimum high time must be at least 1.5 times the X1/CLK period and the minimum low time must be at least equal to the X1/CLK
period if either channel’s Receiver is operating in external 1X clock mode.
Specifications are subject to change without notice
ABSOLUTE MAXIMUM RATINGS
1
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1.
Stresses above those listed under the Absolute Maximum Ratings may cause permanent damage to the device.
This is a stress rat-
ing only, and functional operation of the device at these or any other conditions above those indicated in the “Electrical Characteris-
tics” section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect
device reliability.